Gutierrez Campo, AM.; Brimont, ACJ.; Aamer, M.; Sanchis Kilders, P. (2012). Method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer structure. Optics Communications. 285(6):1144-1147. doi:10.1016/j.optcom.2011.11.064
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/45408
Title:
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Method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer structure
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Author:
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Gutiérrez Campo, Ana María
Brimont, Antoine Christian Jacques
Aamer, Mariam
Sanchis Kilders, Pablo
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UPV Unit:
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Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
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Issued date:
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Abstract:
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In this paper, a method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer (MZI) structure is reported. The method, based on the analysis of the transmission spectra of asymmetric MZIs, ...[+]
In this paper, a method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer (MZI) structure is reported. The method, based on the analysis of the transmission spectra of asymmetric MZIs, enables the propagation losses of the optical waveguides to be calculated without the requirement of identical coupling conditions for each measurement. In addition, the power imbalance of the branching structure in the MZI can also be obtained. Our theoretical analysis is supported by experimental measurements. © 2011 Elsevier B.V. All rights reserved.
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Subjects:
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Microring resonators
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Photonic integrated circuits
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Silicon photonics
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Waveguide modulators
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Branching structures
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Coupling condition
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Experimental measurements
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Microring resonator
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Power imbalance
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Propagation loss
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Transmission spectrums
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Waveguide modulator
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Waveguide propagation
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Electric losses
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Light modulators
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Mach-Zehnder interferometers
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Photonic devices
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Waveguides
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Photonic integration technology
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Copyrigths:
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Cerrado |
Source:
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Optics Communications. (issn:
0030-4018
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DOI:
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10.1016/j.optcom.2011.11.064
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Publisher:
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Elsevier
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Publisher version:
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http://dx.doi.org/10.1016/j.optcom.2011.11.064
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Project ID:
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TEC2008-06360 DEMOTEC
TEC2008-06333 SINADEC
PROMETEO-2010-087 R&D Excellency Program (NANOMET)
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Thanks:
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The authors gratefully acknowledge financial support from TEC2008-06360DEMOTEC, TEC2008-06333SINADEC and PROMETEO-2010-087R&D Excellency Program (NANOMET). The authors thank the fabrication team, A. Griol, J. Hurtado, L ...[+]
The authors gratefully acknowledge financial support from TEC2008-06360DEMOTEC, TEC2008-06333SINADEC and PROMETEO-2010-087R&D Excellency Program (NANOMET). The authors thank the fabrication team, A. Griol, J. Hurtado, L Bellieres, J. A. Ayucar, and F. Lopez for their countless hours of dedicated work.
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Type:
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Artículo
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