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Method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer structure

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Method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer structure

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Gutierrez Campo, AM.; Brimont, ACJ.; Aamer, M.; Sanchis Kilders, P. (2012). Method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer structure. Optics Communications. 285(6):1144-1147. doi:10.1016/j.optcom.2011.11.064

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Title: Method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer structure
Author: Gutiérrez Campo, Ana María Brimont, Antoine Christian Jacques Aamer, Mariam Sanchis Kilders, Pablo
UPV Unit: Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Issued date:
Abstract:
In this paper, a method for measuring waveguide propagation losses by means of a Mach-Zehnder Interferometer (MZI) structure is reported. The method, based on the analysis of the transmission spectra of asymmetric MZIs, ...[+]
Subjects: Microring resonators , Photonic integrated circuits , Silicon photonics , Waveguide modulators , Branching structures , Coupling condition , Experimental measurements , Microring resonator , Power imbalance , Propagation loss , Transmission spectrums , Waveguide modulator , Waveguide propagation , Electric losses , Light modulators , Mach-Zehnder interferometers , Photonic devices , Waveguides , Photonic integration technology
Copyrigths: Cerrado
Source:
Optics Communications. (issn: 0030-4018 )
DOI: 10.1016/j.optcom.2011.11.064
Publisher:
Elsevier
Publisher version: http://dx.doi.org/10.1016/j.optcom.2011.11.064
Project ID:
TEC2008-06360 DEMOTEC
TEC2008-06333 SINADEC
PROMETEO-2010-087 R&D Excellency Program (NANOMET)
Thanks:
The authors gratefully acknowledge financial support from TEC2008-06360DEMOTEC, TEC2008-06333SINADEC and PROMETEO-2010-087R&D Excellency Program (NANOMET). The authors thank the fabrication team, A. Griol, J. Hurtado, L ...[+]
Type: Artículo

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