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Analysis of System Imperfections in a Photonics-Assisted Instantaneous Frequency Measurement Receiver Based on a Dual-Sideband Suppressed-Carrier Modulation

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Analysis of System Imperfections in a Photonics-Assisted Instantaneous Frequency Measurement Receiver Based on a Dual-Sideband Suppressed-Carrier Modulation

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Sanchez Fandiño, JA.; Muñoz Muñoz, P. (2015). Analysis of System Imperfections in a Photonics-Assisted Instantaneous Frequency Measurement Receiver Based on a Dual-Sideband Suppressed-Carrier Modulation. Journal of Lightwave Technology. 33(2):293-303. doi:10.1109/JLT.2014.2378331

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/54466

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Title: Analysis of System Imperfections in a Photonics-Assisted Instantaneous Frequency Measurement Receiver Based on a Dual-Sideband Suppressed-Carrier Modulation
Author:
UPV Unit: Universitat Politècnica de València. Instituto Universitario de Telecomunicación y Aplicaciones Multimedia - Institut Universitari de Telecomunicacions i Aplicacions Multimèdia
Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Issued date:
Abstract:
[EN] Instantaneous frequency measurement receivers are a well-established technology that is used for the ultrafast characterization of pulsed microwave signals over a broad bandwidth. Recently, numerous photonic approaches ...[+]
Subjects: Frequency measurement , Integrated optoelectronics , Microwave measurements , Optical planar waveguides , Optical waveguide filters
Copyrigths: Reserva de todos los derechos
Source:
Journal of Lightwave Technology. (issn: 0733-8724 )
DOI: 10.1109/JLT.2014.2378331
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publisher version: http://dx.doi.org/10.1109/JLT.2014.2378331
Thanks:
This work was supported by projects TEC2010-21337 (ATOMIC), FEDER UPVOV10-3E-492, FEDER UPVOV08-3E-008, TEC2013-42332-P (PIC4ESP), and PROMETEO 2013/012. The work of J. S. Fandino was supported by Grant FPU-2010 (ref: ...[+]
Type: Artículo

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