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Diagnosis of Intermittent Faults in IGBTs Using the Latent Nestling Method with Hybrid Coloured Petri Nets

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Diagnosis of Intermittent Faults in IGBTs Using the Latent Nestling Method with Hybrid Coloured Petri Nets

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dc.contributor.author Rodríguez Urrego, Leonardo es_ES
dc.contributor.author García Moreno, Emilio es_ES
dc.contributor.author Quiles Cucarella, Eduardo es_ES
dc.contributor.author Correcher Salvador, Antonio es_ES
dc.contributor.author Morant Anglada, Francisco José es_ES
dc.contributor.author Piza, Ricardo es_ES
dc.date.accessioned 2016-04-22T11:57:29Z
dc.date.available 2016-04-22T11:57:29Z
dc.date.issued 2015
dc.identifier.issn 1024-123X
dc.identifier.uri http://hdl.handle.net/10251/62852
dc.description.abstract This paper presents a fault diagnosis application of the Latent Nestling Method to IGBTs. The paper extends the Latent Nestling Method based in Coloured Petri Nets (CPNs) to hybrid systems in such a manner that IGBTs performance can be modeled. CPNs allow for an enhanced capability for synthesis and modeling in contrast to the classical phenomena of combinational state explosion when Finite State Machine methods are applied. We present an IGBT model with different fault modes including those of intermittent nature that can be used advantageously as predictive symptoms within a predictive maintenance strategy. Ageing stress tests have been experimentally applied to the IGBTs modules and intermittent faults are diagnosed as precursors of permanent failures. In addition, ageing is validated with morphological analysis (Scanning Electron Microscopy) and semiqualitative analysis (Energy Dispersive Spectrometry). es_ES
dc.description.sponsorship This work was supported by the Spanish Ministerio de Ciencia y Tecnologia Project DPI2009-14744-C03-03, by Generalitat Valenciana Project GV/2010/018, and by Universitat Politecnica de Valencia Project PAID06-08. en_EN
dc.language Inglés es_ES
dc.publisher Hindawi Publishing Corporation es_ES
dc.relation.ispartof Mathematical Problems in Engineering es_ES
dc.rights Reconocimiento (by) es_ES
dc.subject Electric fault currents es_ES
dc.subject Hybrid systems es_ES
dc.subject Logic circuits es_ES
dc.subject Petri nets es_ES
dc.subject Scanning electron microscopy es_ES
dc.subject Coloured Petri Nets es_ES
dc.subject Energy dispersive spectrometry es_ES
dc.subject Fault diagnosis applications es_ES
dc.subject Intermittent fault es_ES
dc.subject Morphological analysis es_ES
dc.subject Predictive maintenance es_ES
dc.subject Semiqualitative analysis es_ES
dc.subject State explosion es_ES
dc.subject.classification INGENIERIA DE SISTEMAS Y AUTOMATICA es_ES
dc.title Diagnosis of Intermittent Faults in IGBTs Using the Latent Nestling Method with Hybrid Coloured Petri Nets es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1155/2015/130790
dc.relation.projectID info:eu-repo/grantAgreement/MICINN//DPI2009-14744-C03-03/ES/Diseño De Un Vehiculo De Inspeccion Submarina Autonoma Para Misiones Oceanicas. Grupo De Investigacion Ai2_Upv/
dc.relation.projectID info:eu-repo/grantAgreement/UPV//PAID-06-08-002-585/
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería de Sistemas y Automática - Departament d'Enginyeria de Sistemes i Automàtica es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto Universitario de Automática e Informática Industrial - Institut Universitari d'Automàtica i Informàtica Industrial es_ES
dc.description.bibliographicCitation Rodríguez Urrego, L.; García Moreno, E.; Quiles Cucarella, E.; Correcher Salvador, A.; Morant Anglada, FJ.; Piza, R. (2015). Diagnosis of Intermittent Faults in IGBTs Using the Latent Nestling Method with Hybrid Coloured Petri Nets. Mathematical Problems in Engineering. 2015:1-14. https://doi.org/10.1155/2015/130790 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1155/2015/130790 es_ES
dc.description.upvformatpinicio 1 es_ES
dc.description.upvformatpfin 14 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 2015 es_ES
dc.relation.senia 281209 es_ES
dc.contributor.funder Ministerio de Ciencia y Tecnología
dc.contributor.funder Universitat Politècnica de València
dc.description.references Rodriguez-Blanco, M. A., Claudio-Sanchez, A., Theilliol, D., Vela-Valdes, L. G., Sibaja-Teran, P., Hernandez-Gonzalez, L., & Aguayo-Alquicira, J. (2011). A Failure-Detection Strategy for IGBT Based on Gate-Voltage Behavior Applied to a Motor Drive System. IEEE Transactions on Industrial Electronics, 58(5), 1625-1633. doi:10.1109/tie.2010.2098355 es_ES
dc.description.references Qi, H., Ganesan, S., & Pecht, M. (2008). No-fault-found and intermittent failures in electronic products. Microelectronics Reliability, 48(5), 663-674. doi:10.1016/j.microrel.2008.02.003 es_ES
dc.description.references Filsecker, F., Alvarez, R., & Bernet, S. (2013). Comparison of 4.5-kV Press-Pack IGBTs and IGCTs for Medium-Voltage Converters. IEEE Transactions on Industrial Electronics, 60(2), 440-449. doi:10.1109/tie.2012.2187417 es_ES
dc.description.references Chen, H., & Lu, S. (2013). Fault Diagnosis Digital Method for Power Transistors in Power Converters of Switched Reluctance Motors. IEEE Transactions on Industrial Electronics, 60(2), 749-763. doi:10.1109/tie.2012.2207661 es_ES
dc.description.references Sleszynski, W., Nieznanski, J., & Cichowski, A. (2009). Open-Transistor Fault Diagnostics in Voltage-Source Inverters by Analyzing the Load Currents. IEEE Transactions on Industrial Electronics, 56(11), 4681-4688. doi:10.1109/tie.2009.2023640 es_ES
dc.description.references Bin Lu, & Sharma, S. K. (2009). A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters. IEEE Transactions on Industry Applications, 45(5), 1770-1777. doi:10.1109/tia.2009.2027535 es_ES
dc.description.references Cruz, S. M. A., Ferreira, M., Mendes, A. M. S., & Cardoso, A. J. M. (2011). Analysis and Diagnosis of Open-Circuit Faults in Matrix Converters. IEEE Transactions on Industrial Electronics, 58(5), 1648-1661. doi:10.1109/tie.2010.2098356 es_ES
dc.description.references Smet, V., Forest, F., Huselstein, J.-J., Richardeau, F., Khatir, Z., Lefebvre, S., & Berkani, M. (2011). Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling. IEEE Transactions on Industrial Electronics, 58(10), 4931-4941. doi:10.1109/tie.2011.2114313 es_ES
dc.description.references Filippetti, F., Franceschini, G., Tassoni, C., & Vas, P. (2000). Recent developments of induction motor drives fault diagnosis using AI techniques. IEEE Transactions on Industrial Electronics, 47(5), 994-1004. doi:10.1109/41.873207 es_ES
dc.description.references Maouad, A., Hoffmann, A., Khoury, A., & Charles, J.-P. (2000). Characterization of high-density current stressed IGBTs and simulation with an adapted SPICE sub-circuit. Microelectronics Reliability, 40(6), 973-979. doi:10.1016/s0026-2714(00)00002-0 es_ES
dc.description.references Estima, J. O., & Marques Cardoso, A. J. (2011). A New Approach for Real-Time Multiple Open-Circuit Fault Diagnosis in Voltage-Source Inverters. IEEE Transactions on Industry Applications, 47(6), 2487-2494. doi:10.1109/tia.2011.2168800 es_ES
dc.description.references Patton, R. J., & Chen, J. (1997). Observer-based fault detection and isolation: Robustness and applications. Control Engineering Practice, 5(5), 671-682. doi:10.1016/s0967-0661(97)00049-x es_ES
dc.description.references Demongodin, I., & Koussoulas, N. T. (1998). Differential Petri nets: representing continuous systems in a discrete-event world. IEEE Transactions on Automatic Control, 43(4), 573-579. doi:10.1109/9.665073 es_ES
dc.description.references Correcher, A., Garcia, E., Morant, F., Quiles, E., & Rodriguez, L. (2012). Intermittent Failure Dynamics Characterization. IEEE Transactions on Reliability, 61(3), 649-658. doi:10.1109/tr.2012.2208300 es_ES


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