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Sub-micrometric reflectometry for localized label-free biosensing

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Sub-micrometric reflectometry for localized label-free biosensing

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Casquel, R.; Soler, JA.; Holgado, M.; Lopez, A.; Lavin, A.; De Vicente, J.; Sanza, FJ.... (2015). Sub-micrometric reflectometry for localized label-free biosensing. Optics Express. 23(10):12544-12554. doi:10.1364/OE.23.012544

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/72676

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Title: Sub-micrometric reflectometry for localized label-free biosensing
Author: Casquel, R. Soler, J. A. Holgado, M. Lopez, A. Lavin, A. de Vicente, J. Sanza, F. J. Laguna, M. F. Holgado Bolaños, Miguel Bañuls Polo, María-José Puchades, Rosa
UPV Unit: Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Universitat Politècnica de València. Departamento de Química - Departament de Química
Issued date:
Abstract:
In this work we present an optical technique for characterizing sub-micrometric areas based on reflectivity of the light as a function of angle of incidence for the two pure polarizations s and p, covering a range of angles ...[+]
Subjects: Optical sensing and sensors , Thin films , Optical properties
Copyrigths: Reserva de todos los derechos
Source:
Optics Express. (issn: 1094-4087 )
DOI: 10.1364/OE.23.012544
Publisher:
Optical Society of America
Publisher version: https://dx.doi.org/10.1364/OE.23.012544
Thanks:
This work has been partially funded under the projects under the projects PLATON (Ref: TEC2012-31145) and INNBIOD (Ref: IPT-2011-1429-01000) from the Ministerio de Economia y Competitividad (MINECO) of Spain. We acknowledge ...[+]
Type: Artículo

References

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