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Design of F-Band Transition From Microstrip to Ridge Gap Waveguide Including Monte Carlo Assembly Tolerance Analysis

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Design of F-Band Transition From Microstrip to Ridge Gap Waveguide Including Monte Carlo Assembly Tolerance Analysis

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Algaba-Brazález, A.; Flygare, J.; Yang, J.; Vassilev, V.; Baquero Escudero, M.; Kildal, P. (2016). Design of F-Band Transition From Microstrip to Ridge Gap Waveguide Including Monte Carlo Assembly Tolerance Analysis. IEEE Transactions on Microwave Theory and Techniques. 64(4):1245-1254. doi:10.1109/TMTT.2016.2535334

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/83592

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Título: Design of F-Band Transition From Microstrip to Ridge Gap Waveguide Including Monte Carlo Assembly Tolerance Analysis
Autor: Algaba-Brazález, Astrid Flygare, Jonas Yang, Jian Vassilev, Vessen Baquero Escudero, Mariano Kildal, Per-Simon
Entidad UPV: Universitat Politècnica de València. Escuela Técnica Superior de Ingenieros de Telecomunicación - Escola Tècnica Superior d'Enginyers de Telecomunicació
Universitat Politècnica de València. Instituto Universitario de Telecomunicación y Aplicaciones Multimedia - Institut Universitari de Telecomunicacions i Aplicacions Multimèdia
Fecha difusión:
Resumen:
This paper describes the design and realization of a transition from a microstrip line to a ridge gap waveguide operating between 95 and 115 GHz. The study includes simulations, measurements, and a Monte Carlo analysis ...[+]
Palabras clave: Artificial magnetic conductor, assembly , F-band , Microstrip , Millimeter-waves , Monte Carlo , Ridge gap waveguide , Tolerance , Transition
Derechos de uso: Reserva de todos los derechos
Fuente:
IEEE Transactions on Microwave Theory and Techniques. (issn: 0018-9480 )
DOI: 10.1109/TMTT.2016.2535334
Editorial:
Institute of Electrical and Electronics Engineers (IEEE)
Versión del editor: http://dx.doi.org/10.1109/TMTT.2016.2535334
Código del Proyecto:
info:eu-repo/grantAgreement/ERC/ERC-2012-ADG/20120216/EU/
Descripción: (c) 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Agradecimientos:
This work was supported in part by the Swedish Research Council VR, the Swedish Governmental Agency for Innovation Systems VIN-NOVA via a project within the VINN Excellence center Chase, and the European Research Council ...[+]
Tipo: Artículo

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