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In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement

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In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement

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García Baños, B.; Catalá Civera, JM.; Peñaranda Foix, FL.; Plaza González, PJ.; Llorens Vallés, G. (2016). In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement. Materials. 9(5):1-10. doi:10.3390/ma9050349

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/92423

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Title: In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Issued date:
Abstract:
[EN] Microwave-assisted processes have recognized advantages over more conventional heating techniques. However, the effects on the materials¿ microstructure are still a matter of study, due to the complexity of the ...[+]
Subjects: Microwave , High temperature , Process monitoring , Dielectric properties , Heating,ceramic materials
Copyrigths: Reconocimiento (by)
Source:
Materials. (issn: 1996-1944 )
DOI: 10.3390/ma9050349
Publisher:
MDPI AG
Publisher version: http://doi.org/10.3390/ma9050349
Type: Artículo

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