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García Baños, B.; Catalá Civera, JM.; Peñaranda Foix, FL.; Plaza González, PJ.; Llorens Vallés, G. (2016). In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement. Materials. 9(5):1-10. doi:10.3390/ma9050349
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/92423
Título: | In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement | |
Autor: | Llorens Vallés, Gabriel | |
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[EN] Microwave-assisted processes have recognized advantages over more conventional heating
techniques. However, the effects on the materials¿ microstructure are still a matter of study, due to
the complexity of the ...[+]
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Derechos de uso: | Reconocimiento (by) | |
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Versión del editor: | http://doi.org/10.3390/ma9050349 | |
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