Test-Fixture for Suspended-Strip Gap-Waveguide Technology on Ka-Band

Gahete Arias, Carlos; Baquero Escudero, Mariano; Valero-Nogueira, Alejandro; Vila Jiménez, Antonio

doi:10.1109/LMWC.2013.2258000

Test-Fixture for Suspended-Strip Gap-Waveguide Technology on Ka-Band

Handle

https://riunet.upv.es/handle/10251/44429

Cita bibliográfica

Gahete Arias, C.; Baquero Escudero, M.; Valero-Nogueira, A.; Vila Jiménez, A. (2013). Test-Fixture for Suspended-Strip Gap-Waveguide Technology on Ka-Band. IEEE Microwave and Wireless Components Letters. 23(6):321-323. https://doi.org/10.1109/LMWC.2013.2258000

Resumen

This letter presents a Test-Fixture for a Suspended-Strip Gap-Waveguide technology that provides a fast measurement system for the prototyping stage. For this purpose, a transition from standard rectangular waveguide to this new technology has been developed. A TRL kit and a repeatability study have been made to ensure the reliability of the process, and several straightforward circuits have been manufactured and measured