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Structural, morphological and optical properties of In2S3 thin films obtained by SILAR method

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Structural, morphological and optical properties of In2S3 thin films obtained by SILAR method

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Sall, T.; Raidou, A.; Elfarrass, S.; Hartiti, B.; Marí, B.; Qachaou, A.; Fahoume, M. (2014). Structural, morphological and optical properties of In2S3 thin films obtained by SILAR method. Optical and Quantum Electronics. 46(1):247-257. doi:10.1007/s11082-013-9786-x

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Título: Structural, morphological and optical properties of In2S3 thin films obtained by SILAR method
Autor: Sall, Thierno Raidou, A. Elfarrass, S. Hartiti, B. Marí, B. Qachaou, A. Fahoume, Mounir
Entidad UPV: Universitat Politècnica de València. Departamento de Física Aplicada - Departament de Física Aplicada
Universitat Politècnica de València. Instituto de Diseño para la Fabricación y Producción Automatizada - Institut de Disseny per a la Fabricació i Producció Automatitzada
Fecha difusión:
Resumen:
[EN] In2S3 thin films have been elaborated onto glass substrate by SILAR method at room temperature using different immersion time in the solution of cation and anion and fixing the rinsing time. The film composition, ...[+]
Palabras clave: In2S3 , Thin films , SILAR method , Photovoltaic
Derechos de uso: Cerrado
Fuente:
Optical and Quantum Electronics. (issn: 0306-8919 )
DOI: 10.1007/s11082-013-9786-x
Editorial:
Springer-Verlag
Versión del editor: https://doi.org/10.1007/s11082-013-9786-x
Tipo: Artículo

References

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