- -

Guest Editorial Special Section on Advanced Signal and Image Processing Techniques for Electric Machines and Drives Fault Diagnosis and Prognosis

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Compartir/Enviar a

Citas

Estadísticas

  • Estadisticas de Uso

Guest Editorial Special Section on Advanced Signal and Image Processing Techniques for Electric Machines and Drives Fault Diagnosis and Prognosis

Mostrar el registro completo del ítem

Antonino-Daviu, J.; Lee, SB.; Strangas, E. (2017). Guest Editorial Special Section on Advanced Signal and Image Processing Techniques for Electric Machines and Drives Fault Diagnosis and Prognosis. IEEE Transactions on Industrial Informatics. 13(3):1257-1260. doi:10.1109/TII.2017.2690464

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/103513

Ficheros en el ítem

Thumbnail
Nombre: FINAL VERSION.pdf
Tamaño: 700.2Kb
Formato: PDF
Descripción: Versión del Autor.
Abrir/Preview
[Cerrado]
Nombre: PAPER DEF PUBLISH ...
Tamaño: 212.1Kb
Formato: PDF
Descripción: Versión editorial
Solicitar una copia al autor

Metadatos del ítem

Título: Guest Editorial Special Section on Advanced Signal and Image Processing Techniques for Electric Machines and Drives Fault Diagnosis and Prognosis
Autor: Antonino-Daviu, J. Lee, Sang Bin Strangas, Elias
Entidad UPV: Universitat Politècnica de València. Departamento de Ingeniería Eléctrica - Departament d'Enginyeria Elèctrica
Fecha difusión:
Fecha de fin de embargo: 2018-06-01
Resumen:
[EN] With the expansion of the use of electrical drive sys- tems to more critical applications, the issue of reliability and fault mitigation and condition-based maintenance have consequently taken an increasing importance: ...[+]
Palabras clave: Feature extraction , Fault diagnosis , Prognostics and health management , Electric machines , Estimation , Sensors , Mathematical model
Derechos de uso: Reserva de todos los derechos
Fuente:
IEEE Transactions on Industrial Informatics. (issn: 1551-3203 )
DOI: 10.1109/TII.2017.2690464
Editorial:
Institute of Electrical and Electronics Engineers
Versión del editor: http://doi.org/10.1109/TII.2017.2690464
Descripción: © 2017 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works
Tipo: Artículo

recommendations

 

Este ítem aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro completo del ítem