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Magnetic and structural properties of stoichiometric thin Fe3Si/GaAs(001) films

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Magnetic and structural properties of stoichiometric thin Fe3Si/GaAs(001) films

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dc.contributor.author Ionescu, A. es_ES
dc.contributor.author Vaz, C.A.F. es_ES
dc.contributor.author Trypiniotis, T. es_ES
dc.contributor.author Gürtler, C. M. es_ES
dc.contributor.author Vickers, M. E. es_ES
dc.contributor.author García Miquel, Ángel Héctor es_ES
dc.contributor.author Bland, J.A.C. es_ES
dc.date.accessioned 2018-07-06T04:26:13Z
dc.date.available 2018-07-06T04:26:13Z
dc.date.issued 2005 es_ES
dc.identifier.issn 0304-8853 es_ES
dc.identifier.uri http://hdl.handle.net/10251/105346
dc.description.abstract [EN] In this study, we report experimental results on the structural and magnetic properties of epitaxial Fe3Si films grown on GaAs(0 0 1) by co-evaporation. X-ray reflectivity shows that relatively smooth interfaces are obtained (roughness approximate to0.7 nm for the Fe3Si/GaAs interface), while SQUID magnetometry yields a magnetic moment Of 0.9 mu(B)/atom at room temperature, close to the bulk value. From magneto-optic Kerr effect measurements the cubic anisotropy constant was estimated as K-1 = 3.1 X 10(4) erg/cm(3). The electrical transport properties were also investigated by I-V and photoexcitation measurements, which show a Schottky behaviour (with a barrier height of 0.51 eV) and that spin detection is possible in this system. (0 2004 Elsevier B.V. All rights reserved. es_ES
dc.language Inglés es_ES
dc.publisher Elsevier es_ES
dc.relation.ispartof Journal of Magnetism and Magnetic Materials es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Fe3Si/GaAs(001) es_ES
dc.subject Interface roughness es_ES
dc.subject Magnetic moment es_ES
dc.subject Schottky barrier es_ES
dc.subject Spin detection es_ES
dc.subject.classification TECNOLOGIA ELECTRONICA es_ES
dc.title Magnetic and structural properties of stoichiometric thin Fe3Si/GaAs(001) films es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1016/j.jmmm.2004.09.042 es_ES
dc.rights.accessRights Cerrado es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica es_ES
dc.description.bibliographicCitation Ionescu, A.; Vaz, C.; Trypiniotis, T.; Gürtler, CM.; Vickers, ME.; García Miquel, ÁH.; Bland, J. (2005). Magnetic and structural properties of stoichiometric thin Fe3Si/GaAs(001) films. Journal of Magnetism and Magnetic Materials. 286:72-76. doi:10.1016/j.jmmm.2004.09.042 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://doi.org/10.1016/j.jmmm.2004.09.042 es_ES
dc.description.upvformatpinicio 72 es_ES
dc.description.upvformatpfin 76 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 286 es_ES
dc.relation.pasarela S\27172 es_ES


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