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Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters

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Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters

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Reig, J.; Rubio Arjona, L.; Cardona Marcet, N. (2005). Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters. En 2004 IEEE 59th Vehicular Technology Conference. VTC 2004-Spring. IEEE. 367-370. doi:10.1109/VETECS.2004.1387976

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/113320

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Title: Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters
Author: Reig, Juan Rubio Arjona, Lorenzo Cardona Marcet, Narciso
UPV Unit: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Issued date:
Abstract:
[EN] In this paper, an infinite convergent series for outage probabilities of dual selection combiners (SC) in a correlated Nakagami fading with arbitrary fading parameters (not necessary identical) is derived. Moments of ...[+]
Subjects: Diversity , Fading channels
Copyrigths: Reserva de todos los derechos
ISBN: 0-7803-8256-0
Source:
2004 IEEE 59th Vehicular Technology Conference. VTC 2004-Spring. (issn: 1550-2252 )
DOI: 10.1109/VETECS.2004.1387976
Publisher:
IEEE
Publisher version: http://doi.org/10.1109/VETECS.2004.1387976
Conference name: 59 th IEEE Vehicular Technology Conference (VTC9
Conference place: Milán, Italia
Conference date: Mayo 17-19,2004
Type: Capítulo de libro Comunicación en congreso

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