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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

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dc.contributor.author Bañón, David es_ES
dc.contributor.author Socuellamos, J. M. es_ES
dc.contributor.author Mata-Sanz, Rafael es_ES
dc.contributor.author Mercadé-Morales, Laura es_ES
dc.contributor.author Gimeno Martínez, Benito es_ES
dc.contributor.author Boria Esbert, Vicente Enrique es_ES
dc.contributor.author Raboso García-Baquero, David es_ES
dc.contributor.author Semenov, V. es_ES
dc.contributor.author Rakova, E.I es_ES
dc.contributor.author Sánchez-Royo, J. F. es_ES
dc.contributor.author Segura García del Río, Alfredo es_ES
dc.date.accessioned 2019-05-31T20:43:50Z
dc.date.available 2019-05-31T20:43:50Z
dc.date.issued 2018 es_ES
dc.identifier.issn 0093-3813 es_ES
dc.identifier.uri http://hdl.handle.net/10251/121371
dc.description © 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.description.abstract [EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found. es_ES
dc.description.sponsorship The authors would like to thank the European High Power Space Materials Laboratory for its contribution-a laboratory funded by the European Regional Development Fund-a way of making Europe. Many thanks to the University of Valencia (Spain) for supporting this research activity with the internal program "Assistance for temporary stays of invited researchers within the framework of the Subprogramme Attraction of Talent 2015". es_ES
dc.language Inglés es_ES
dc.publisher Institute of Electrical and Electronics Engineers es_ES
dc.relation.ispartof IEEE Transactions on Plasma Science es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Multipactor effect es_ES
dc.subject Radio frequency es_ES
dc.subject Secondary electron emission (SEE) es_ES
dc.subject Secondary electron yield es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1109/TPS.2018.2809602 es_ES
dc.relation.projectID info:eu-repo/grantAgreement/MINECO//TEC2016-75934-C4-1-R/ES/DEMOSTRADORES TECNOLOGICOS DE FILTROS Y MULTIPLEXORES CON RESPUESTAS SELECTIVAS Y SINTONIZABLES EN NUEVAS GUIAS COMPACTAS PARA APLICACIONES ESPACIALES/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Sistemas Informáticos y Computación - Departament de Sistemes Informàtics i Computació es_ES
dc.description.bibliographicCitation Bañón, D.; Socuellamos, JM.; Mata-Sanz, R.; Mercadé-Morales, L.; Gimeno Martínez, B.; Boria Esbert, VE.; Raboso García-Baquero, D.... (2018). Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models. IEEE Transactions on Plasma Science. 46(4):859-867. https://doi.org/10.1109/TPS.2018.2809602 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://doi.org/10.1109/TPS.2018.2809602 es_ES
dc.description.upvformatpinicio 859 es_ES
dc.description.upvformatpfin 867 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 46 es_ES
dc.description.issue 4 es_ES
dc.relation.pasarela S\383341 es_ES
dc.contributor.funder Ministerio de Economía y Competitividad es_ES


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