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dc.contributor.author | Celuch, Malgorzata | es_ES |
dc.contributor.author | Rudnicki, Janusz | es_ES |
dc.contributor.author | Krupka, Jerzy | es_ES |
dc.contributor.author | Gwarek, Wojciech | es_ES |
dc.date.accessioned | 2019-11-11T15:54:36Z | |
dc.date.available | 2019-11-11T15:54:36Z | |
dc.date.issued | 2019-10-15 | |
dc.identifier.isbn | 9788490487198 | |
dc.identifier.uri | http://hdl.handle.net/10251/130739 | |
dc.description.abstract | [EN] This paper describes the application of dielectric resonators (DR) to the measurements of surface impedance of microwave susceptors. We demonstrate that the single-post (SiPDR) configuration is applicable to plain susceptors before use, while the split-post (SPDR) configuration - to crazed susceptors after use. Attention is given to the full characterisation of active packaging, that is, the influence of paper support on the overall electric losses is also investigated. The measurements can be preformed with various form-factor VNAs, including benchtop VNAs and hand-held FieldFox, though the most economical setup is constructed with a dedicated computer-controlled microwave signal oscillator system available under the name of Q-Meter. Finally, an extension of dielectric resonator measurements to surface imaging is presented, achieved by incorporating the resonator in a 2D automatic scanner. | es_ES |
dc.description.sponsorship | This project has received funding from the European Union’s Horizon 2020 research and innovation programme (H2020-NMBP-07-2017) under grant agreement MMAMA No. 761036. | es_ES |
dc.format.extent | 6 | es_ES |
dc.language | Inglés | es_ES |
dc.publisher | Editorial Universitat Politècnica de València | es_ES |
dc.relation.ispartof | AMPERE 2019. 17th International Conference on Microwave and High Frequency Heating | es_ES |
dc.rights | Reconocimiento - No comercial - Sin obra derivada (by-nc-nd) | es_ES |
dc.subject | Energy Production by Microwaves | es_ES |
dc.subject | Microwave CVD | es_ES |
dc.subject | EM Modelling | es_ES |
dc.subject | Microwave Material interaction | es_ES |
dc.subject | Dielectric Properties | es_ES |
dc.subject | Dielectric Properties Measurement | es_ES |
dc.subject | Solid State Microwave | es_ES |
dc.subject | Microwave Processing | es_ES |
dc.subject | Microwave Chemistry | es_ES |
dc.subject | Microwave applicators design | es_ES |
dc.title | Application of dielectric resonators to surface impedance measurements of microwave susceptors | es_ES |
dc.type | Capítulo de libro | es_ES |
dc.type | Comunicación en congreso | es_ES |
dc.identifier.doi | 10.4995/AMPERE2019.2019.9953 | |
dc.relation.projectID | info:eu-repo/grantAgreement/EC/H2020/761036/EU/Microwave Microscopy for Advanced and Efficient Materials Analysis and Production/ | es_ES |
dc.rights.accessRights | Abierto | es_ES |
dc.description.bibliographicCitation | Celuch, M.; Rudnicki, J.; Krupka, J.; Gwarek, W. (2019). Application of dielectric resonators to surface impedance measurements of microwave susceptors. En AMPERE 2019. 17th International Conference on Microwave and High Frequency Heating. Editorial Universitat Politècnica de València. 500-505. https://doi.org/10.4995/AMPERE2019.2019.9953 | es_ES |
dc.description.accrualMethod | OCS | es_ES |
dc.relation.conferencename | Ampere 2019 | es_ES |
dc.relation.conferencedate | Septiembre 09-12,2019 | es_ES |
dc.relation.conferenceplace | Valencia, Spain | es_ES |
dc.relation.publisherversion | http://ocs.editorial.upv.es/index.php/AMPERE2019/AMPERE2019/paper/view/9953 | es_ES |
dc.description.upvformatpinicio | 500 | es_ES |
dc.description.upvformatpfin | 505 | es_ES |
dc.type.version | info:eu-repo/semantics/publishedVersion | es_ES |
dc.relation.pasarela | OCS\9953 | es_ES |
dc.contributor.funder | European Commission | es_ES |