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Sánchez Diana, LD.; Rosa Escutia, Á.; Griol Barres, A.; Gutierrez Campo, AM.; Homm, P.; Van Bilzen, B.; Menghini, M.... (2017). Impact of the external resistance on the switching power consumption in VO2 nano gap junctions. Applied Physics Letters. 111(3):1-4. https://doi.org/10.1063/1.4994326
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/132995
Título: | Impact of the external resistance on the switching power consumption in VO2 nano gap junctions | |
Autor: | Sánchez Diana, Luis David Rosa Escutia, Álvaro Homm, Pia Van Bilzen, Bart Menghini, Mariela Locquet, Jean-Pierre | |
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[EN] The influence of an external resistance on the performance of VO2 nanogap junctions is analyzed and experimentally characterized. The current-voltage response shows the reversible metal-insulator transition typical ...[+]
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Derechos de uso: | Reserva de todos los derechos | |
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Versión del editor: | https://doi.org/10.1063/1.4994326 | |
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This work was supported by the European Commission under Project No. FP7-ICT-2013-11-619456 SITOGA. Financial support from TEC2016-76849-C2-2-R and NANOMET Conselleria de Educacio, Cultura i Esport-PROMETEOII/2014 034 is ...[+]
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