Thermo-optic coefficient of porous silicon in the infrared region and oxidation process at low temperatures

Abstract

[EN] In this work, a porous silicon nanostructure has been fabricated by electrochemical means and used as a thermal sensor. The thermo-optic effect in the near infrared region has been experimentally studied based on spectroscopy measurements. Values of the thermo-optic coefficient between 3.2 and 7.9·10¿5 K¿1 have been obtained, depending on the porosity, reaching a maximum thermal sensitivity of 91 ± 3 pm/°C during the experiments carried out with the fabricated samples. Additionally, the oxidation process of the sensor at temperatures below 500 K has been studied, showing that the growth of the silicon oxide was dependent on the characteristics of the porous layers. Based on the experimental results, a mathematical model was developed to estimate the evolution of the oxidation process as a function of porosity and thickness.