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Single trace terahertz spectroscopic ellipsometry

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Single trace terahertz spectroscopic ellipsometry

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Báez-Chorro, MÁ.; Vidal Rodriguez, B. (2019). Single trace terahertz spectroscopic ellipsometry. Optics Express. 27(24):35468-35474. https://doi.org/10.1364/OE.27.035468

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/142678

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Título: Single trace terahertz spectroscopic ellipsometry
Autor: Báez-Chorro, Miguel Ángel Vidal Rodriguez, Borja
Entidad UPV: Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Fecha difusión:
Resumen:
[EN] A new technique for terahertz time-domain ellipsometry is presented. Information of reflection coefficients of the sample in two orthogonal polarizations is encoded on the same terahertz trace by using a birefringent ...[+]
Palabras clave: Time-domain spectroscopy , Birefringence measurement
Derechos de uso: Reconocimiento - No comercial (by-nc)
Fuente:
Optics Express. (issn: 1094-4087 )
DOI: 10.1364/OE.27.035468
Editorial:
The Optical Society
Versión del editor: https://doi.org/10.1364/OE.27.035468
Código del Proyecto:
info:eu-repo/grantAgreement/MINECO//TEC2016-80906-R/ES/CARACTERIZACION DE LA DISPERSION DE MICRO%2FNANO ADITIVOS MEDIANTE SENSADO ULTRARRAPIDO DE THZ/
Descripción: © 2019 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited"
Agradecimientos:
Ministerio de Ciencia, Innovación y Universidades (TEC2016-80906-R).
Tipo: Artículo

References

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