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Single trace terahertz spectroscopic ellipsometry

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Single trace terahertz spectroscopic ellipsometry

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Báez-Chorro, MÁ.; Vidal Rodriguez, B. (2019). Single trace terahertz spectroscopic ellipsometry. Optics Express. 27(24):35468-35474. https://doi.org/10.1364/OE.27.035468

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/142678

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Title: Single trace terahertz spectroscopic ellipsometry
Author: Báez-Chorro, Miguel Ángel Vidal Rodriguez, Borja
UPV Unit: Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Issued date:
Abstract:
[EN] A new technique for terahertz time-domain ellipsometry is presented. Information of reflection coefficients of the sample in two orthogonal polarizations is encoded on the same terahertz trace by using a birefringent ...[+]
Subjects: Time-domain spectroscopy , Birefringence measurement
Copyrigths: Reconocimiento - No comercial (by-nc)
Source:
Optics Express. (issn: 1094-4087 )
DOI: 10.1364/OE.27.035468
Publisher:
The Optical Society
Publisher version: https://doi.org/10.1364/OE.27.035468
Project ID:
AEI/TEC2016-80906-R
Description: © 2019 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited"
Thanks:
Ministerio de Ciencia, Innovación y Universidades (TEC2016-80906-R).
Type: Artículo

References

Bockelt, A., Palaci Lopez, J., & Vidal, B. (2015). All-Fiber Centralized Architecture for Parallel Terahertz Sensors. IEEE Transactions on Terahertz Science and Technology, 5(1), 137-144. doi:10.1109/tthz.2014.2373313

Khazan, M., Meissner, R., & Wilke, I. (2001). Convertible transmission-reflection time-domain terahertz spectrometer. Review of Scientific Instruments, 72(8), 3427-3430. doi:10.1063/1.1384433

Liu, H.-B., Chen, Y., Bastiaans, G. J., & Zhang, X.-C. (2006). Detection and identification of explosive RDX by THz diffuse reflection spectroscopy. Optics Express, 14(1), 415. doi:10.1364/opex.14.000415 [+]
Bockelt, A., Palaci Lopez, J., & Vidal, B. (2015). All-Fiber Centralized Architecture for Parallel Terahertz Sensors. IEEE Transactions on Terahertz Science and Technology, 5(1), 137-144. doi:10.1109/tthz.2014.2373313

Khazan, M., Meissner, R., & Wilke, I. (2001). Convertible transmission-reflection time-domain terahertz spectrometer. Review of Scientific Instruments, 72(8), 3427-3430. doi:10.1063/1.1384433

Liu, H.-B., Chen, Y., Bastiaans, G. J., & Zhang, X.-C. (2006). Detection and identification of explosive RDX by THz diffuse reflection spectroscopy. Optics Express, 14(1), 415. doi:10.1364/opex.14.000415

Sanjuan, F., Bockelt, A., & Vidal, B. (2014). Birefringence measurement in the terahertz range based on double Fourier analysis. Optics Letters, 39(4), 809. doi:10.1364/ol.39.000809

Nagashima, T., & Hangyo, M. (2001). Measurement of complex optical constants of a highly doped Si wafer using terahertz ellipsometry. Applied Physics Letters, 79(24), 3917-3919. doi:10.1063/1.1426258

Matsumoto, N., Hosokura, T., Nagashima, T., & Hangyo, M. (2011). Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry. Optics Letters, 36(2), 265. doi:10.1364/ol.36.000265

Galuza, A. A., Kiseliov, V. K., Kolenov, I. V., Belyaeva, A. I., & Kuleshov, Y. M. (2016). Developments in THz-Range Ellipsometry: Quasi-Optical Ellipsometer. IEEE Transactions on Terahertz Science and Technology, 6(2), 183-190. doi:10.1109/tthz.2016.2525732

Morris, C. M., Aguilar, R. V., Stier, A. V., & Armitage, N. P. (2012). Polarization modulation time-domain terahertz polarimetry. Optics Express, 20(11), 12303. doi:10.1364/oe.20.012303

Iwata, T., Uemura, H., Mizutani, Y., & Yasui, T. (2014). Double-modulation reflection-type terahertz ellipsometer for measuring the thickness of a thin paint coating. Optics Express, 22(17), 20595. doi:10.1364/oe.22.020595

Byrne, M. B., Shaukat, M. U., Cunningham, J. E., Linfield, E. H., & Davies, A. G. (2011). Simultaneous measurement of orthogonal components of polarization in a free-space propagating terahertz signal using electro-optic detection. Applied Physics Letters, 98(15), 151104. doi:10.1063/1.3579258

Guo, Q., Zhang, Y., Lyu, Z., Zhang, D., Huang, Y., Meng, C., … Yuan, J. (2019). THz Time-Domain Spectroscopic Ellipsometry With Simultaneous Measurements of Orthogonal Polarizations. IEEE Transactions on Terahertz Science and Technology, 9(4), 422-429. doi:10.1109/tthz.2019.2921200

Pupeza, I., Wilk, R., & Koch, M. (2007). Highly accurate optical material parameter determination with THz time-domain spectroscopy. Optics Express, 15(7), 4335. doi:10.1364/oe.15.004335

Grischkowsky, D., Keiding, S., van Exter, M., & Fattinger, C. (1990). Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors. Journal of the Optical Society of America B, 7(10), 2006. doi:10.1364/josab.7.002006

Kim, Y., Yi, M., Kim, B. G., & Ahn, J. (2011). Investigation of THz birefringence measurement and calculation in Al_2O_3 and LiNbO_3. Applied Optics, 50(18), 2906. doi:10.1364/ao.50.002906

Chen, X., Parrott, E. P. J., Huang, Z., Chan, H.-P., & Pickwell-MacPherson, E. (2018). Robust and accurate terahertz time-domain spectroscopic ellipsometry. Photonics Research, 6(8), 768. doi:10.1364/prj.6.000768

Neshat, M., & Armitage, N. P. (2012). Terahertz time-domain spectroscopic ellipsometry: instrumentation and calibration. Optics Express, 20(27), 29063. doi:10.1364/oe.20.029063

Van Exter, M., Fattinger, C., & Grischkowsky, D. (1989). Terahertz time-domain spectroscopy of water vapor. Optics Letters, 14(20), 1128. doi:10.1364/ol.14.001128

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