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Single trace terahertz spectroscopic ellipsometry

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Single trace terahertz spectroscopic ellipsometry

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Nombre: Báez-Chorro;Vidal ...
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dc.contributor.author Báez-Chorro, Miguel Ángel es_ES
dc.contributor.author Vidal Rodriguez, Borja es_ES
dc.date.accessioned 2020-05-07T05:57:00Z
dc.date.available 2020-05-07T05:57:00Z
dc.date.issued 2019-11-25 es_ES
dc.identifier.issn 1094-4087 es_ES
dc.identifier.uri http://hdl.handle.net/10251/142678
dc.description © 2019 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited" es_ES
dc.description.abstract [EN] A new technique for terahertz time-domain ellipsometry is presented. Information of reflection coefficients of the sample in two orthogonal polarizations is encoded on the same terahertz trace by using a birefringent medium. This allows for single measurement refractive index extraction without the need for a moving analyzer. A comparison of the complex refractive index measurements of optical grade fused silica and non birefringent sapphire are carried out both in reflection ellipsometry and with a standard terahertz transmission spectrometer showing good agreement. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement es_ES
dc.description.sponsorship Ministerio de Ciencia, Innovación y Universidades (TEC2016-80906-R). es_ES
dc.language Inglés es_ES
dc.publisher The Optical Society es_ES
dc.relation.ispartof Optics Express es_ES
dc.rights Reconocimiento - No comercial (by-nc) es_ES
dc.subject Time-domain spectroscopy es_ES
dc.subject Birefringence measurement es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Single trace terahertz spectroscopic ellipsometry es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1364/OE.27.035468 es_ES
dc.relation.projectID info:eu-repo/grantAgreement/MINECO//TEC2016-80906-R/ES/CARACTERIZACION DE LA DISPERSION DE MICRO%2FNANO ADITIVOS MEDIANTE SENSADO ULTRARRAPIDO DE THZ/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.description.bibliographicCitation Báez-Chorro, MÁ.; Vidal Rodriguez, B. (2019). Single trace terahertz spectroscopic ellipsometry. Optics Express. 27(24):35468-35474. https://doi.org/10.1364/OE.27.035468 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion https://doi.org/10.1364/OE.27.035468 es_ES
dc.description.upvformatpinicio 35468 es_ES
dc.description.upvformatpfin 35474 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 27 es_ES
dc.description.issue 24 es_ES
dc.relation.pasarela S\394840 es_ES
dc.contributor.funder Ministerio de Economía y Competitividad es_ES
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