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Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection

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Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection

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Saiz-Adalid, L.; Gracia-Morán, J.; Gil Tomás, DA.; Baraza Calvo, JC.; Gil, P. (14-1). Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection. IEEE Access. 7:151131-151143. https://doi.org/10.1109/ACCESS.2019.2947315

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/144214

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Title: Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Issued date:
Abstract:
[Otros] Reliable computer systems employ error control codes (ECCs) to protect information from errors. For example, memories are frequently protected using single error correction-double error detection (SEC-DED) codes. ...[+]
Subjects: Adjacent error correction , Double error detection , Error control codes , Fast codes , Reliability
Copyrigths: Reconocimiento (by)
Source:
IEEE Access. (eissn: 2169-3536 )
DOI: 10.1109/ACCESS.2019.2947315
Publisher:
Institute of Electrical and Electronics Engineers
Publisher version: https://doi.org/10.1109/ACCESS.2019.2947315
Description: (c) 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Thanks:
This work was supported in part by the Spanish Government under Project TIN2016-81075-R, and in part by the Primeros Proyectos de Investigacion, Vicerrectorado de Investigacion, Innovacion y Transferencia de la Universitat ...[+]
Type: Artículo

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