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Fault Modeling of Graphene Nanoribbon FET Logic Circuits

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Fault Modeling of Graphene Nanoribbon FET Logic Circuits

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Gil Tomás, DA.; Gracia-Morán, J.; Saiz-Adalid, L.; Gil, P. (2019). Fault Modeling of Graphene Nanoribbon FET Logic Circuits. Electronics. 8(8):1-18. https://doi.org/10.3390/electronics8080851

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Título: Fault Modeling of Graphene Nanoribbon FET Logic Circuits
Autor: Gil Tomás, Daniel Antonio Gracia-Morán, Joaquín Saiz-Adalid, Luis-J. Gil, Pedro
Entidad UPV: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Fecha difusión:
Resumen:
[EN] Due to the increasing defect rates in highly scaled complementary metal-oxide-semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability challenges are of growing importance. ...[+]
Palabras clave: Emerging nanodevices , Graphene nanoribbon FET , Defects and variations , Fault models , Logic circuits
Derechos de uso: Reconocimiento (by)
Fuente:
Electronics. (eissn: 2079-9292 )
DOI: 10.3390/electronics8080851
Editorial:
MDPI AG
Versión del editor: https://doi.org/10.3390/electronics8080851
Código del Proyecto:
info:eu-repo/grantAgreement/UPV//200190032/
info:eu-repo/grantAgreement/UPV//PAID-06-18/
info:eu-repo/grantAgreement/MINECO//TIN2016-81075-R/ES/MECANISMOS DE ADAPTACION CONFIABLE PARA VEHICULOS AUTONOMOS Y CONECTADOS/
info:eu-repo/grantAgreement/UPV//SP20180334/
Agradecimientos:
This work was supported in part by the Spanish Government under the research project TIN2016-81075-R and by Primeros Proyectos de Investigacion (PAID-06-18), Vicerrectorado de Investigacion, Innovacion y Transferencia de ...[+]
Tipo: Artículo

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