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Hierarchical Clustering of Materials With Defects Using Impact-Echo Testing

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Hierarchical Clustering of Materials With Defects Using Impact-Echo Testing

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Igual García, J. (2020). Hierarchical Clustering of Materials With Defects Using Impact-Echo Testing. IEEE Transactions on Instrumentation and Measurement. 69(8):5316-5324. https://doi.org/10.1109/TIM.2020.2964911

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/167197

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Título: Hierarchical Clustering of Materials With Defects Using Impact-Echo Testing
Autor: Igual García, Jorge
Entidad UPV: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Fecha difusión:
Resumen:
[EN] Signals obtained from impact-echo techniques can be used to detect and classify the defects in damaged materials. The defects change the wave propagation between the impact and the sensors producing particular spectrum ...[+]
Palabras clave: Testing , Clustering algorithms, Bayes methods , Principal component analysis , Data models , Sensors , Probabilistic logic , Classification , Hierarchical clustering , Impact echo (IE) , Kullback-Leibler (KL) divergence , Mixture of Gaussians (MoG)
Derechos de uso: Reserva de todos los derechos
Fuente:
IEEE Transactions on Instrumentation and Measurement. (issn: 0018-9456 )
DOI: 10.1109/TIM.2020.2964911
Editorial:
Institute of Electrical and Electronics Engineers
Versión del editor: https://doi.org/10.1109/TIM.2020.2964911
Descripción: "© © 2020 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."
Tipo: Artículo

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