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Parametric effects by using the strip-pair comparison method around red CIE color center

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Parametric effects by using the strip-pair comparison method around red CIE color center

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dc.contributor.author Brusola Simón, Fernando es_ES
dc.contributor.author Tortajada Montañana, Ignacio es_ES
dc.contributor.author Lengua, Ismael es_ES
dc.contributor.author Jorda-Albiñana, Begoña es_ES
dc.contributor.author Peris Fajarnes, Guillermo es_ES
dc.date.accessioned 2021-11-05T14:11:48Z
dc.date.available 2021-11-05T14:11:48Z
dc.date.issued 2020-07-06 es_ES
dc.identifier.issn 1094-4087 es_ES
dc.identifier.uri http://hdl.handle.net/10251/176476
dc.description.abstract [EN] The strip comparison method, based on the serial exploration method described by Torgerson [Theory and Methods of Scaling; Wiley & Sons (1958); Chap. 7], for the development of near-threshold color difference models was presented and validated with theoretical data by the authors in a previous work. In this study, we investigate parametric effects derived from the use of the strip comparison method on chromaticity-discrimination ellipses around the red CIE color center. The results obtained led to the conclusion that the strip comparison method has little effect on the parameters of the chromaticity-discrimination ellipses determined by the pair comparison method when pairs of patches in the strips are separated by a black line 0.5 mm thick or are separated by 3 mm spacing on a white background and also correlates well with the parameters reported by other authors using the pair comparison method at the threshold. es_ES
dc.language Inglés es_ES
dc.publisher The Optical Society es_ES
dc.relation.ispartof Optics Express es_ES
dc.rights Reconocimiento (by) es_ES
dc.subject.classification DIBUJO es_ES
dc.subject.classification EXPRESION GRAFICA EN LA INGENIERIA es_ES
dc.title Parametric effects by using the strip-pair comparison method around red CIE color center es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1364/OE.395291 es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería Gráfica - Departament d'Enginyeria Gràfica es_ES
dc.description.bibliographicCitation Brusola Simón, F.; Tortajada Montañana, I.; Lengua, I.; Jorda-Albiñana, B.; Peris Fajarnes, G. (2020). Parametric effects by using the strip-pair comparison method around red CIE color center. Optics Express. 28(14):19966-19977. https://doi.org/10.1364/OE.395291 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion https://doi.org/10.1364/OE.395291 es_ES
dc.description.upvformatpinicio 19966 es_ES
dc.description.upvformatpfin 19977 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 28 es_ES
dc.description.issue 14 es_ES
dc.identifier.pmid 32680065 es_ES
dc.relation.pasarela S\418501 es_ES


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