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dc.contributor.author | Brusola Simón, Fernando![]() |
es_ES |
dc.contributor.author | Tortajada Montañana, Ignacio![]() |
es_ES |
dc.contributor.author | Lengua, Ismael![]() |
es_ES |
dc.contributor.author | Jorda-Albiñana, Begoña![]() |
es_ES |
dc.contributor.author | Peris Fajarnes, Guillermo![]() |
es_ES |
dc.date.accessioned | 2021-11-05T14:11:48Z | |
dc.date.available | 2021-11-05T14:11:48Z | |
dc.date.issued | 2020-07-06 | es_ES |
dc.identifier.issn | 1094-4087 | es_ES |
dc.identifier.uri | http://hdl.handle.net/10251/176476 | |
dc.description.abstract | [EN] The strip comparison method, based on the serial exploration method described by Torgerson [Theory and Methods of Scaling; Wiley & Sons (1958); Chap. 7], for the development of near-threshold color difference models was presented and validated with theoretical data by the authors in a previous work. In this study, we investigate parametric effects derived from the use of the strip comparison method on chromaticity-discrimination ellipses around the red CIE color center. The results obtained led to the conclusion that the strip comparison method has little effect on the parameters of the chromaticity-discrimination ellipses determined by the pair comparison method when pairs of patches in the strips are separated by a black line 0.5 mm thick or are separated by 3 mm spacing on a white background and also correlates well with the parameters reported by other authors using the pair comparison method at the threshold. | es_ES |
dc.language | Inglés | es_ES |
dc.publisher | The Optical Society | es_ES |
dc.relation.ispartof | Optics Express | es_ES |
dc.rights | Reconocimiento (by) | es_ES |
dc.subject.classification | DIBUJO | es_ES |
dc.subject.classification | EXPRESION GRAFICA EN LA INGENIERIA | es_ES |
dc.title | Parametric effects by using the strip-pair comparison method around red CIE color center | es_ES |
dc.type | Artículo | es_ES |
dc.identifier.doi | 10.1364/OE.395291 | es_ES |
dc.rights.accessRights | Abierto | es_ES |
dc.contributor.affiliation | Universitat Politècnica de València. Departamento de Ingeniería Gráfica - Departament d'Enginyeria Gràfica | es_ES |
dc.description.bibliographicCitation | Brusola Simón, F.; Tortajada Montañana, I.; Lengua, I.; Jorda-Albiñana, B.; Peris Fajarnes, G. (2020). Parametric effects by using the strip-pair comparison method around red CIE color center. Optics Express. 28(14):19966-19977. https://doi.org/10.1364/OE.395291 | es_ES |
dc.description.accrualMethod | S | es_ES |
dc.relation.publisherversion | https://doi.org/10.1364/OE.395291 | es_ES |
dc.description.upvformatpinicio | 19966 | es_ES |
dc.description.upvformatpfin | 19977 | es_ES |
dc.type.version | info:eu-repo/semantics/publishedVersion | es_ES |
dc.description.volume | 28 | es_ES |
dc.description.issue | 14 | es_ES |
dc.identifier.pmid | 32680065 | es_ES |
dc.relation.pasarela | S\418501 | es_ES |