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Bru-Orgiles, LA.; Pastor Abellán, D.; Muñoz, P. (2021). Advanced and versatile interferometric technique for the characterization of photonic integrated devices. Optics Express. 29(22):36503-36515. https://doi.org/10.1364/OE.435683
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/185586
Título: | Advanced and versatile interferometric technique for the characterization of photonic integrated devices | |
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[EN] Adaptable and complex optical characterization of photonic integrated devices, permitting to unearth possible design and fabrication errors in the different workflow steps are highly desired in the community. Here, ...[+]
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Derechos de uso: | Reconocimiento (by) | |
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Versión del editor: | https://doi.org/10.1364/OE.435683 | |
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Ministerio de Economia y Competitividad (PTA2015-11309-I, TEC2015-69787-REDT PIC4TB, TEC201680385-P SINXPECT); Ministerio de Ciencia, Innovacion y Universidades (PID2019-110877GB-I00 BHYSINPICS); Generalitat Valenciana ...[+]
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