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Sangeetha, R.; Logeshwaran, J.; Rocher, J.; Lloret, J. (2023). An Improved Agro Deep Learning Model for Detection of Panama Wilts Disease in Banana Leaves. AgriEngineering. 5(2):660-679. https://doi.org/10.3390/agriengineering5020042
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/204709
Título: | An Improved Agro Deep Learning Model for Detection of Panama Wilts Disease in Banana Leaves | |
Autor: | Sangeetha, Ramachandran Logeshwaran, Jaganathan | |
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[EN] Recently, Panama wilt disease that attacks banana leaves has caused enormous economic losses to farmers. Early detection of this disease and necessary preventive measures can avoid economic damage. This paper proposes ...[+]
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Derechos de uso: | Reconocimiento (by) | |
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Versión del editor: | https://doi.org/10.3390/agriengineering5020042 | |
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