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An Improved Agro Deep Learning Model for Detection of Panama Wilts Disease in Banana Leaves

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An Improved Agro Deep Learning Model for Detection of Panama Wilts Disease in Banana Leaves

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dc.contributor.author Sangeetha, Ramachandran es_ES
dc.contributor.author Logeshwaran, Jaganathan es_ES
dc.contributor.author Rocher, Javier es_ES
dc.contributor.author Lloret, Jaime es_ES
dc.date.accessioned 2024-06-04T18:08:44Z
dc.date.available 2024-06-04T18:08:44Z
dc.date.issued 2023-06 es_ES
dc.identifier.uri http://hdl.handle.net/10251/204709
dc.description.abstract [EN] Recently, Panama wilt disease that attacks banana leaves has caused enormous economic losses to farmers. Early detection of this disease and necessary preventive measures can avoid economic damage. This paper proposes an improved method to predict Panama wilt disease based on symptoms using an agro deep learning algorithm. The proposed deep learning model for detecting Panama wilts disease is essential because it can help accurately identify infected plants in a timely manner. It can be instrumental in large-scale agricultural operations where Panama wilts disease could spread quickly and cause significant crop loss. Additionally, deep learning models can be used to monitor the effectiveness of treatments and help farmers make informed decisions about how to manage the disease best. This method is designed to predict the severity of the disease and its consequences based on the arrangement of color and shape changes in banana leaves. The present proposed method is compared with its previous methods, and it achieved 91.56% accuracy, 91.61% precision, 88.56% recall and 81.56% F1-score. es_ES
dc.language Inglés es_ES
dc.publisher MDPI es_ES
dc.relation.ispartof AgriEngineering es_ES
dc.rights Reconocimiento (by) es_ES
dc.subject Panama wilts disease es_ES
dc.subject Deep learning es_ES
dc.subject Accuracy es_ES
dc.subject Precision es_ES
dc.subject Recall es_ES
dc.subject F1-score es_ES
dc.subject.classification INGENIERÍA TELEMÁTICA es_ES
dc.title An Improved Agro Deep Learning Model for Detection of Panama Wilts Disease in Banana Leaves es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.3390/agriengineering5020042 es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Escuela Politécnica Superior de Gandia - Escola Politècnica Superior de Gandia es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Tecnología de Alimentos - Departament de Tecnologia d'Aliments es_ES
dc.description.bibliographicCitation Sangeetha, R.; Logeshwaran, J.; Rocher, J.; Lloret, J. (2023). An Improved Agro Deep Learning Model for Detection of Panama Wilts Disease in Banana Leaves. AgriEngineering. 5(2):660-679. https://doi.org/10.3390/agriengineering5020042 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion https://doi.org/10.3390/agriengineering5020042 es_ES
dc.description.upvformatpinicio 660 es_ES
dc.description.upvformatpfin 679 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 5 es_ES
dc.description.issue 2 es_ES
dc.identifier.eissn 2624-7402 es_ES
dc.relation.pasarela S\496522 es_ES


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