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Characterizing and modeling backscattering in silicon microring resonators

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Characterizing and modeling backscattering in silicon microring resonators

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dc.contributor.author Ballesteros García, Guillem es_ES
dc.contributor.author Matres Abril, Joaquín es_ES
dc.contributor.author Martí Sendra, Javier es_ES
dc.contributor.author Oton Nieto, Claudio José es_ES
dc.date.accessioned 2013-07-10T10:23:33Z
dc.date.available 2013-07-10T10:23:33Z
dc.date.issued 2011
dc.identifier.issn 1094-4087
dc.identifier.uri http://hdl.handle.net/10251/30984
dc.description This paper was published in OPTICS EXPRESS and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.19.024980. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law es_ES
dc.description.abstract We present an experimental technique to characterize back-scattering in silicon microring resonators, together with a simple analytical model that reproduces the experimental results. The model can extract all the key parameters of an add-drop-type resonator, which are the loss, both coupling coefficients and backscattering. We show that the backscattering effect strongly affects the resonance shape, and that consecutive resonances of the same ring can have very different backscattering parameters. © 2011 Optical Society of America. es_ES
dc.description.sponsorship The authors acknowledge financial support from the Spanish Ministry of Science and Innovation through contract SINADEC (TEC2008-06333). Joaquin Matres is supported by the Formacion de Personal Investigador grant program of the Universidad Politecnica de Valencia. en_EN
dc.language Inglés es_ES
dc.publisher Optical Society of America es_ES
dc.relation.ispartof Optics Express es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Analytical model es_ES
dc.subject Coupling coefficient es_ES
dc.subject Experimental techniques es_ES
dc.subject Key parameters es_ES
dc.subject Microring resonator es_ES
dc.subject Mathematical models es_ES
dc.subject Optical resonators es_ES
dc.subject Backscattering es_ES
dc.subject Silicon es_ES
dc.subject Article es_ES
dc.subject Chemistry es_ES
dc.subject Computer aided design es_ES
dc.subject Computer simulation es_ES
dc.subject Equipment es_ES
dc.subject Equipment design es_ES
dc.subject Light es_ES
dc.subject Optical instrumentation es_ES
dc.subject Radiation scattering es_ES
dc.subject Theoretical model es_ES
dc.subject Transducer es_ES
dc.subject Computer-Aided Design es_ES
dc.subject Equipment Failure Analysis es_ES
dc.subject Lenses es_ES
dc.subject Models, Theoretical es_ES
dc.subject Optical Devices es_ES
dc.subject Scattering, Radiation es_ES
dc.subject Transducers es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Characterizing and modeling backscattering in silicon microring resonators es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1364/OE.19.024980
dc.relation.projectID info:eu-repo/grantAgreement/MICINN//TEC2008-06333/ES/DISPOSITIVOS NANOFOTONICOS EN SILICIO/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.description.bibliographicCitation Ballesteros García, G.; Matres Abril, J.; Martí Sendra, J.; Oton Nieto, CJ. (2011). Characterizing and modeling backscattering in silicon microring resonators. Optics Express. 19(25):24980-24985. https://doi.org/10.1364/OE.19.024980 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1364/OE.19.024980 es_ES
dc.description.upvformatpinicio 24980 es_ES
dc.description.upvformatpfin 24985 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 19 es_ES
dc.description.issue 25 es_ES
dc.relation.senia 206087
dc.contributor.funder Ministerio de Ciencia e Innovación es_ES
dc.contributor.funder Universitat Politècnica de València es_ES
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