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Analyzing the impact of intermittent faults on microprocessors applying fault injection

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Analyzing the impact of intermittent faults on microprocessors applying fault injection

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Gil Tomás, DA.; Gracia-Morán, J.; Baraza Calvo, JC.; Saiz-Adalid, L.; Gil, P. (2012). Analyzing the impact of intermittent faults on microprocessors applying fault injection. IEEE Design and Test of Computers. 29(6):66-73. https://doi.org/10.1109/MDT.2011.2179514

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/36081

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Title: Analyzing the impact of intermittent faults on microprocessors applying fault injection
Author: Gil Tomás, Daniel Antonio Gracia-Morán, Joaquín Baraza Calvo, Juan Carlos Saiz-Adalid, Luis-J. Gil, Pedro
UPV Unit: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Issued date:
Abstract:
Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which ...[+]
Subjects: Reliability
Copyrigths: Cerrado
Source:
IEEE Design and Test of Computers. (issn: 0740-7475 )
DOI: 10.1109/MDT.2011.2179514
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publisher version: http://dx.doi.org/10.1109/MDT.2011.2179514
Project ID:
info:eu-repo/grantAgreement/MICINN//TIN2009-13825/ES/Sistemas Empotrados Seguros Y Confiables Basados En Componentes/
Thanks:
This work was supported by the Spanish Government under the project TIN2009-13825.
Type: Artículo

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