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A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs

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A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs

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dc.contributor.author Ghiribaldi, Alberto es_ES
dc.contributor.author Ludovici, Daniele es_ES
dc.contributor.author Triviño, Francisco es_ES
dc.contributor.author Strano, Alessandro es_ES
dc.contributor.author Flich Cardo, José es_ES
dc.contributor.author Sanchez Garcia, Jose Luis es_ES
dc.contributor.author Alfaro, Francisco es_ES
dc.contributor.author Favalli, Michelle es_ES
dc.contributor.author Bertozzi, Davide es_ES
dc.date.accessioned 2014-09-16T08:18:56Z
dc.date.issued 2013-06
dc.identifier.issn 1539-9087
dc.identifier.uri http://hdl.handle.net/10251/39673
dc.description © ACM, 2013. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in PUBLICATION, ACM Transactions on Embedded Computing Systems, Vol. 12, No. 4, Article 106, Publication date: June 2013.http://doi.acm.org/10.1145/2485984.2485994 es_ES
dc.description.abstract [EN] Networks-on-chip need to survive to manufacturing faults in order to sustain yield. An effective testing and configuration strategy however implies two opposite requirements. One one hand, a fast and scalable built-in self-testing and self-diagnosis procedure has to be carried out concurrently at NoC switches. On the other hand, programming the NoC routing mechanism to go around faulty links and switches can be optimally performed by a centralized controller with global network visibility. To the best of our knowledge, this article proposes for the first time a global network testing and configuration strategy that meets the opposite requirements by means of a fault-tolerant dual network architecture and a fast configuration algorithm for the most common failure patterns. Experimental results report an area overhead as low as 12.5% with respect to the baseline switch architecture while achieving a high degree of fault tolerance. In fact, even when multiple stuck-at faults are considered, the capability of fault masking by the dual network is always over 80%, and the support for multiple link failures is more than 90% in presence of two unusable links in the main network with minimum set-up times. es_ES
dc.description.sponsorship This work was supported by the NANOC European Project (FPT7-ICT-248972) and by the HiPEAC Network of Excellence (Interconnect Cluster). en_EN
dc.language Inglés es_ES
dc.publisher Association for Computing Machinery (ACM) es_ES
dc.relation HiPEAC Network of Excellence (Interconnect Cluster) es_ES
dc.relation.ispartof ACM Transactions in Embedded Computing Systems es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Design es_ES
dc.subject Algorithms es_ES
dc.subject Reliability es_ES
dc.subject Network-on-Chip es_ES
dc.subject Fault Tolerance es_ES
dc.subject Testing es_ES
dc.subject.classification ARQUITECTURA Y TECNOLOGIA DE COMPUTADORES es_ES
dc.title A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1145/2485984.2485994
dc.relation.projectID info:eu-repo/grantAgreement/EC/FP7/248972/EU/Nanoscale Silicon-Aware Network-on-Chip Design Platform/
dc.rights.accessRights Cerrado es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors es_ES
dc.description.bibliographicCitation Ghiribaldi, A.; Ludovici, D.; Triviño, F.; Strano, A.; Flich Cardo, J.; Sanchez Garcia, JL.; Alfaro, F.... (2013). A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs. ACM Transactions in Embedded Computing Systems. 12(4):106:1-106:29. https://doi.org/10.1145/2485984.2485994 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1145/2485984.2485994 es_ES
dc.description.upvformatpinicio 106:1 es_ES
dc.description.upvformatpfin 106:29 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 12 es_ES
dc.description.issue 4 es_ES
dc.relation.senia 264534
dc.contributor.funder European Commission


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