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Birefringence measurement in the THz range based on double Fourier analysis

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Birefringence measurement in the THz range based on double Fourier analysis

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dc.contributor.author Sanjuan, Federico es_ES
dc.contributor.author Bockelt, Alexander Stefan es_ES
dc.contributor.author Vidal Rodriguez, Borja es_ES
dc.date.accessioned 2014-11-04T14:43:36Z
dc.date.available 2014-11-04T14:43:36Z
dc.date.issued 2014-02-15
dc.identifier.issn 0146-9592
dc.identifier.uri http://hdl.handle.net/10251/43852
dc.description This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OL.39.000809. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law" es_ES
dc.description.abstract A method for obtaining the average refractive indexes of a birefringent material in the terahertz region in a single measurement with a standard terahertz time-domain spectrometer is presented. The method is based on processing the frequency-domain interference between terahertz pulses and echoes through the Fourier transform of the terahertz spectrum. The technique also allows the determination of the optical axis orientation of the material by making two measurements with different angles of the sample optical axis. (C) 2014 Optical Society of America es_ES
dc.description.sponsorship The authors thank the Erasmus Mundus scholarship and the Consejo Nacional de Investigaciones Cientificas y Tecnicas (Conicet) that support the work of Federico Sanjuan at Universitat Politecnica de Valencia and the Spanish Ministerio de Economia y Competitividad for partially supporting this work through project TEC2012-35797. Federico Sanjuan also thanks Dr. Jorge Tocho for his encouragement and support. en_EN
dc.language Inglés es_ES
dc.publisher Optical Society of America es_ES
dc.relation.ispartof Optics Letters es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject TIME-DOMAIN SPECTROSCOPY es_ES
dc.subject ORIENTATION es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Birefringence measurement in the THz range based on double Fourier analysis es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1364/OL.39.000809
dc.relation.projectID info:eu-repo/grantAgreement/MINECO//TEC2012-35797/ES/ESPECTROSCOPIA DE TERAHERCIOS EN FIBRA OPTICA PARA APLICACIONES DE SENSADO DE MATERIALES/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.description.bibliographicCitation Sanjuan, F.; Bockelt, AS.; Vidal Rodriguez, B. (2014). Birefringence measurement in the THz range based on double Fourier analysis. Optics Letters. 39(4):809-812. https://doi.org/10.1364/OL.39.000809 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1364/OL.39.000809 es_ES
dc.description.upvformatpinicio 809 es_ES
dc.description.upvformatpfin 812 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 39 es_ES
dc.description.issue 4 es_ES
dc.relation.senia 253909
dc.contributor.funder Ministerio de Economía y Competitividad es_ES
dc.contributor.funder Consejo Nacional de Investigaciones Científicas y Técnicas, Argentina es_ES
dc.contributor.funder European Commission
dc.contributor.funder Erasmus+
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dc.description.references Duvillaret, L., Garet, F., & Coutaz, J.-L. (2000). Influence of noise on the characterization of materials by terahertz time-domain spectroscopy. Journal of the Optical Society of America B, 17(3), 452. doi:10.1364/josab.17.000452 es_ES
dc.description.references Grischkowsky, D., Keiding, S., van Exter, M., & Fattinger, C. (1990). Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors. Journal of the Optical Society of America B, 7(10), 2006. doi:10.1364/josab.7.002006 es_ES


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