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Patent Overlay Mapping: Visualizing Technological Distance

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Kay L.; Newman, N.; Youtie, J.; Porter A.L.; Rafols García, I. (2014). Patent Overlay Mapping: Visualizing Technological Distance. Journal of the American Society for Information Science and Technology. 65(12):2432-2443. doi:10.1002/asi.23146

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/44358

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Title: Patent Overlay Mapping: Visualizing Technological Distance
Author: Kay L. Newman, N. Youtie, J. Porter A.L. Rafols García, Ismael
UPV Unit: Universitat Politècnica de València. Instituto de Gestión de la Innovación y del Conocimiento - Institut de Gestió de la Innovació i del Coneixement
Issued date:
Abstract:
This paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique ...[+]
Subjects: Information mapping , Innovation , Patents
Copyrigths: Reserva de todos los derechos
Source:
Journal of the American Society for Information Science and Technology. (issn: 1532-2882 )
DOI: 10.1002/asi.23146
Publisher:
Association for Information Science and Technology (ASIS&T): JASIS&T
Publisher version: http://dx.doi.org/10.1002/asi.23146
Project ID:
U.S. National Science Foundation (NSF) No. 0531194 No. 1064146
Center for Nanotechnology in Society, University of California Santa Barbara (NSF Awards No. 0938099 and No. 0531184)
Thanks:
We thank Kevin Boyack, Loet Leydesdorff, and Antoine Schoen for open and fruitful discussions about this paper. This research was undertaken largely at Georgia Tech drawing on support from the U.S. National Science Foundation ...[+]
Type: Artículo

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