Ruiz Muñoz, D.; Llovera Segovia, P.; Pomar, V.; Quijano Lopez, A. (2013). Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks. Journal of Electrostatics. 71(3):336-340. doi:10.1016/j.elstat.2012.12.030
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/46380
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Title:
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Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks
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Author:
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Ruiz Muñoz, David
Llovera Segovia, Pedro
Pomar, V.
Quijano Lopez, Alfredo
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UPV Unit:
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Universitat Politècnica de València. Departamento de Ingeniería Eléctrica - Departament d'Enginyeria Elèctrica
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Issued date:
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Abstract:
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The influence of many parameters on the electric discharges at U50% can only be correlated by means of an analysis of a large amount of experimental data. The 50% probability of breakdown is considered a random process. ...[+]
The influence of many parameters on the electric discharges at U50% can only be correlated by means of an analysis of a large amount of experimental data. The 50% probability of breakdown is considered a random process. We have investigated how to find relevant statistical differences leading to breakdown or withstanding during an impulse voltage test under the same conditions for a plane high voltage electrode and a grounded electrode configuration. An analysis based on Neural Network discrimination has been developed which indicates that measurements do contain some relevant information test at early stages in a reduced time frame. (c) 2012 Elsevier B.V. All rights reserved.
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Subjects:
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Breakdown
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U50
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Streamer discharge
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Leader discharge
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Neural Network
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Copyrigths:
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Cerrado |
Source:
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Journal of Electrostatics. (issn:
0304-3886
)
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DOI:
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10.1016/j.elstat.2012.12.030
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Publisher:
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Elsevier
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Publisher version:
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http://dx.doi.org/10.1016/j.elstat.2012.12.030
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Type:
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Artículo
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