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Ruiz Muñoz, D.; Llovera Segovia, P.; Pomar, V.; Quijano Lopez, A. (2013). Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks. Journal of Electrostatics. 71(3):336-340. doi:10.1016/j.elstat.2012.12.030
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Título: | Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks | |
Autor: | Ruiz Muñoz, David Pomar, V. | |
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The influence of many parameters on the electric discharges at U50% can only be correlated by means of an analysis of a large amount of experimental data. The 50% probability of breakdown is considered a random process. ...[+]
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Derechos de uso: | Cerrado | |
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Versión del editor: | http://dx.doi.org/10.1016/j.elstat.2012.12.030 | |
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