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Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks

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Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks

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dc.contributor.author Ruiz Muñoz, David es_ES
dc.contributor.author Llovera Segovia, Pedro es_ES
dc.contributor.author Pomar, V. es_ES
dc.contributor.author Quijano Lopez, Alfredo es_ES
dc.date.accessioned 2015-01-26T12:19:53Z
dc.date.available 2015-01-26T12:19:53Z
dc.date.issued 2013-06
dc.identifier.issn 0304-3886
dc.identifier.uri http://hdl.handle.net/10251/46380
dc.description.abstract The influence of many parameters on the electric discharges at U50% can only be correlated by means of an analysis of a large amount of experimental data. The 50% probability of breakdown is considered a random process. We have investigated how to find relevant statistical differences leading to breakdown or withstanding during an impulse voltage test under the same conditions for a plane high voltage electrode and a grounded electrode configuration. An analysis based on Neural Network discrimination has been developed which indicates that measurements do contain some relevant information test at early stages in a reduced time frame. (c) 2012 Elsevier B.V. All rights reserved. es_ES
dc.language Inglés es_ES
dc.publisher Elsevier es_ES
dc.relation.ispartof Journal of Electrostatics es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Breakdown es_ES
dc.subject U50 es_ES
dc.subject Streamer discharge es_ES
dc.subject Leader discharge es_ES
dc.subject Neural Network es_ES
dc.subject.classification INGENIERIA ELECTRICA es_ES
dc.title Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1016/j.elstat.2012.12.030
dc.rights.accessRights Cerrado es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería Eléctrica - Departament d'Enginyeria Elèctrica es_ES
dc.description.bibliographicCitation Ruiz Muñoz, D.; Llovera Segovia, P.; Pomar, V.; Quijano Lopez, A. (2013). Analysis of breakdown process at U50 voltage for plane rod discharges by means of Neural Networks. Journal of Electrostatics. 71(3):336-340. doi:10.1016/j.elstat.2012.12.030 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1016/j.elstat.2012.12.030 es_ES
dc.description.upvformatpinicio 336 es_ES
dc.description.upvformatpfin 340 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 71 es_ES
dc.description.issue 3 es_ES
dc.relation.senia 256804


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