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Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

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Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

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Sanjuan, F.; Bockelt, A.; Vidal Rodriguez, B. (2014). Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement. Applied Optics. 53(22):4910-4913. doi:10.1364/AO.53.004910

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/48195

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Title: Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
Author: Sanjuan, Federico Bockelt, Alexander Vidal Rodriguez, Borja
UPV Unit: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Issued date:
Abstract:
A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the ...[+]
Subjects: Optical properties , Spectroscopy, terahertz , Interference
Copyrigths: Cerrado
Source:
Applied Optics. (issn: 0003-6935 )
DOI: 10.1364/AO.53.004910
Publisher:
Optical Society of America
Publisher version: http://dx.doi.org/10.1364/AO.53.004910
Project ID:
Spanish Ministerio de Economia y Competitividad [TEC2012-35797]
Thanks:
The authors thank the Spanish Ministerio de Economia y Competitividad for partially supporting this work through project TEC2012-35797. Federico Sanjuan also thanks Dr. Jorge Tocho and Dr. Alberto Lencina for their ...[+]
Type: Artículo

References

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Jepsen, P. U., Cooke, D. G., & Koch, M. (2010). Terahertz spectroscopy and imaging - Modern techniques and applications. Laser & Photonics Reviews, 5(1), 124-166. doi:10.1002/lpor.201000011

Tompkins, H. G., & Irene, E. A. (Eds.). (2005). Handbook of Ellipsometry. doi:10.1007/3-540-27488-x [+]
Fischer, B. M., Helm, H., & Jepsen, P. U. (2007). Chemical Recognition With Broadband THz Spectroscopy. Proceedings of the IEEE, 95(8), 1592-1604. doi:10.1109/jproc.2007.898904

Jepsen, P. U., Cooke, D. G., & Koch, M. (2010). Terahertz spectroscopy and imaging - Modern techniques and applications. Laser & Photonics Reviews, 5(1), 124-166. doi:10.1002/lpor.201000011

Tompkins, H. G., & Irene, E. A. (Eds.). (2005). Handbook of Ellipsometry. doi:10.1007/3-540-27488-x

Ralph, S. E., Perkowitz, S., Katzenellenbogen, N., & Grischkowsky, D. (1994). Terahertz spectroscopy of optically thick multilayered semiconductor structures. Journal of the Optical Society of America B, 11(12), 2528. doi:10.1364/josab.11.002528

Wilk, R., Pupeza, I., Cernat, R., & Koch, M. (2008). Highly Accurate THz Time-Domain Spectroscopy of Multilayer Structures. IEEE Journal of Selected Topics in Quantum Electronics, 14(2), 392-398. doi:10.1109/jstqe.2007.910981

Hejase, J. A., Rothwell, E. J., & Chahal, P. (2013). A Multiple Angle Method for THz Time-Domain Material Characterization. IEEE Transactions on Terahertz Science and Technology, 3(5), 656-665. doi:10.1109/tthz.2013.2278460

Sanjuan, F., & Vidal, B. (2014). Refractive index calculation from echo interference in pulsed terahertz spectroscopy. Electronics Letters, 50(4), 308-309. doi:10.1049/el.2013.3937

Sanjuan, F., Bockelt, A., & Vidal, B. (2014). Birefringence measurement in the terahertz range based on double Fourier analysis. Optics Letters, 39(4), 809. doi:10.1364/ol.39.000809

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