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Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

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Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

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Sanjuan, F.; Bockelt, A.; Vidal Rodriguez, B. (2014). Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement. Applied Optics. 53(22):4910-4913. doi:10.1364/AO.53.004910

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/48195

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Title: Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
Author: Sanjuan, Federico Bockelt, Alexander Vidal Rodriguez, Borja
UPV Unit: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Issued date:
Abstract:
A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the ...[+]
Subjects: Optical properties , Spectroscopy, terahertz , Interference
Copyrigths: Cerrado
Source:
Applied Optics. (issn: 0003-6935 )
DOI: 10.1364/AO.53.004910
Publisher:
Optical Society of America
Publisher version: http://dx.doi.org/10.1364/AO.53.004910
Project ID:
Spanish Ministerio de Economia y Competitividad [TEC2012-35797]
Thanks:
The authors thank the Spanish Ministerio de Economia y Competitividad for partially supporting this work through project TEC2012-35797. Federico Sanjuan also thanks Dr. Jorge Tocho and Dr. Alberto Lencina for their ...[+]
Type: Artículo

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