Sanjuan, F.; Bockelt, A.; Vidal Rodriguez, B. (2014). Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement. Applied Optics. 53(22):4910-4913. doi:10.1364/AO.53.004910
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/48195
Title: | Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement | |
Author: | Sanjuan, Federico Bockelt, Alexander | |
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A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the ...[+]
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Copyrigths: | Cerrado | |
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Publisher version: | http://dx.doi.org/10.1364/AO.53.004910 | |
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The authors thank the Spanish Ministerio de Economia y Competitividad for partially supporting this work through project TEC2012-35797. Federico Sanjuan also thanks Dr. Jorge Tocho and Dr. Alberto Lencina for their ...[+]
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