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dc.contributor.author | Sanjuan, Federico | es_ES |
dc.contributor.author | Bockelt, Alexander | es_ES |
dc.contributor.author | Vidal Rodriguez, Borja | es_ES |
dc.date.accessioned | 2015-03-23T15:14:53Z | |
dc.date.available | 2015-03-23T15:14:53Z | |
dc.date.issued | 2014-08-01 | |
dc.identifier.issn | 0003-6935 | |
dc.identifier.uri | http://hdl.handle.net/10251/48195 | |
dc.description.abstract | A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products. (C) 2014 Optical Society of America | es_ES |
dc.description.sponsorship | The authors thank the Spanish Ministerio de Economia y Competitividad for partially supporting this work through project TEC2012-35797. Federico Sanjuan also thanks Dr. Jorge Tocho and Dr. Alberto Lencina for their encouragement and support. | en_EN |
dc.language | Inglés | es_ES |
dc.publisher | Optical Society of America | es_ES |
dc.relation.ispartof | Applied Optics | es_ES |
dc.rights | Reserva de todos los derechos | es_ES |
dc.subject | Optical properties | es_ES |
dc.subject | Spectroscopy, terahertz | es_ES |
dc.subject | Interference | es_ES |
dc.subject.classification | TEORIA DE LA SEÑAL Y COMUNICACIONES | es_ES |
dc.title | Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement | es_ES |
dc.type | Artículo | es_ES |
dc.identifier.doi | 10.1364/AO.53.004910 | |
dc.relation.projectID | info:eu-repo/grantAgreement/MINECO//TEC2012-35797/ES/ESPECTROSCOPIA DE TERAHERCIOS EN FIBRA OPTICA PARA APLICACIONES DE SENSADO DE MATERIALES/ | es_ES |
dc.rights.accessRights | Cerrado | es_ES |
dc.contributor.affiliation | Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions | es_ES |
dc.contributor.affiliation | Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica | es_ES |
dc.description.bibliographicCitation | Sanjuan, F.; Bockelt, A.; Vidal Rodriguez, B. (2014). Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement. Applied Optics. 53(22):4910-4913. https://doi.org/10.1364/AO.53.004910 | es_ES |
dc.description.accrualMethod | S | es_ES |
dc.relation.publisherversion | http://dx.doi.org/10.1364/AO.53.004910 | es_ES |
dc.description.upvformatpinicio | 4910 | es_ES |
dc.description.upvformatpfin | 4913 | es_ES |
dc.type.version | info:eu-repo/semantics/publishedVersion | es_ES |
dc.description.volume | 53 | es_ES |
dc.description.issue | 22 | es_ES |
dc.relation.senia | 268630 | |
dc.contributor.funder | Ministerio de Economía y Competitividad | es_ES |
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dc.description.references | Sanjuan, F., & Vidal, B. (2014). Refractive index calculation from echo interference in pulsed terahertz spectroscopy. Electronics Letters, 50(4), 308-309. doi:10.1049/el.2013.3937 | es_ES |
dc.description.references | Sanjuan, F., Bockelt, A., & Vidal, B. (2014). Birefringence measurement in the terahertz range based on double Fourier analysis. Optics Letters, 39(4), 809. doi:10.1364/ol.39.000809 | es_ES |