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Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

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Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

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dc.contributor.author Sanjuan, Federico es_ES
dc.contributor.author Bockelt, Alexander es_ES
dc.contributor.author Vidal Rodriguez, Borja es_ES
dc.date.accessioned 2015-03-23T15:14:53Z
dc.date.available 2015-03-23T15:14:53Z
dc.date.issued 2014-08-01
dc.identifier.issn 0003-6935
dc.identifier.uri http://hdl.handle.net/10251/48195
dc.description.abstract A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products. (C) 2014 Optical Society of America es_ES
dc.description.sponsorship The authors thank the Spanish Ministerio de Economia y Competitividad for partially supporting this work through project TEC2012-35797. Federico Sanjuan also thanks Dr. Jorge Tocho and Dr. Alberto Lencina for their encouragement and support. en_EN
dc.language Inglés es_ES
dc.publisher Optical Society of America es_ES
dc.relation.ispartof Applied Optics es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Optical properties es_ES
dc.subject Spectroscopy, terahertz es_ES
dc.subject Interference es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1364/AO.53.004910
dc.relation.projectID info:eu-repo/grantAgreement/MINECO//TEC2012-35797/ES/ESPECTROSCOPIA DE TERAHERCIOS EN FIBRA OPTICA PARA APLICACIONES DE SENSADO DE MATERIALES/ es_ES
dc.rights.accessRights Cerrado es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica es_ES
dc.description.bibliographicCitation Sanjuan, F.; Bockelt, A.; Vidal Rodriguez, B. (2014). Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement. Applied Optics. 53(22):4910-4913. https://doi.org/10.1364/AO.53.004910 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1364/AO.53.004910 es_ES
dc.description.upvformatpinicio 4910 es_ES
dc.description.upvformatpfin 4913 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 53 es_ES
dc.description.issue 22 es_ES
dc.relation.senia 268630
dc.contributor.funder Ministerio de Economía y Competitividad es_ES
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dc.description.references Sanjuan, F., & Vidal, B. (2014). Refractive index calculation from echo interference in pulsed terahertz spectroscopy. Electronics Letters, 50(4), 308-309. doi:10.1049/el.2013.3937 es_ES
dc.description.references Sanjuan, F., Bockelt, A., & Vidal, B. (2014). Birefringence measurement in the terahertz range based on double Fourier analysis. Optics Letters, 39(4), 809. doi:10.1364/ol.39.000809 es_ES


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