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Statistical Process Control based on Multivariate Image Analysis: A new proposal for monitoring and defect detection

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Statistical Process Control based on Multivariate Image Analysis: A new proposal for monitoring and defect detection

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dc.contributor.author Prats Montalbán, José Manuel es_ES
dc.contributor.author Ferrer Riquelme, Alberto José es_ES
dc.date.accessioned 2015-05-15T12:50:22Z
dc.date.available 2015-05-15T12:50:22Z
dc.date.issued 2014-12-04
dc.identifier.issn 0098-1354
dc.identifier.uri http://hdl.handle.net/10251/50302
dc.description.abstract The monitoring, fault detection and visualization of defects are a strategic issue for product quality. This paper presents a novel methodology based on the integration of textural Multivariate image analysis (MIA) and multivariate statistical process control (MSPC) for process monitoring. The proposed approach combines MIA and p-control charts, as well as T2 and RSS images for defect location and visualization. Simulated images of steel plates are used to illustrate the monitoring performance of it. Both approaches are also applied on real clover images. es_ES
dc.description.sponsorship The authors want to thank Ole Mathis Kruse and Prof. Cecilia Futsaether, from the Norwegian University of Life Sciences (Dept. of Mathematic Sciences and Technology), for providing the real image data set. This research work was partially supported by the Spanish Ministry of Economy and Competitiveness under the project DPI 2011-28112-C04-02. en_EN
dc.language Inglés es_ES
dc.publisher Elsevier es_ES
dc.relation.ispartof Computers and Chemical Engineering es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Multivariate Image Analysis (MIA) es_ES
dc.subject ARL es_ES
dc.subject Control charts es_ES
dc.subject RSS image es_ES
dc.subject T2 image es_ES
dc.subject Wavelets es_ES
dc.subject.classification ESTADISTICA E INVESTIGACION OPERATIVA es_ES
dc.title Statistical Process Control based on Multivariate Image Analysis: A new proposal for monitoring and defect detection es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1016/j.compchemeng.2014.09.014
dc.relation.projectID info:eu-repo/grantAgreement/MICINN//DPI2011-28112-C04-02/ES/MONITORIZACION, INFERENCIA, OPTIMIZACION Y CONTROL MULTI-ESCALA: DE CELULAS A BIORREACTORES. (MULTISCALES)/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Estadística e Investigación Operativa Aplicadas y Calidad - Departament d'Estadística i Investigació Operativa Aplicades i Qualitat es_ES
dc.description.bibliographicCitation Prats Montalbán, JM.; Ferrer Riquelme, AJ. (2014). Statistical Process Control based on Multivariate Image Analysis: A new proposal for monitoring and defect detection. Computers and Chemical Engineering. 71:501-511. https://doi.org/10.1016/j.compchemeng.2014.09.014 es_ES
dc.description.accrualMethod S es_ES
dc.description.upvformatpinicio 501 es_ES
dc.description.upvformatpfin 511 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 71 es_ES
dc.relation.senia 274093
dc.contributor.funder Ministerio de Ciencia e Innovación es_ES


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