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Accurate chromatic dispersion characterization of photonic integrated circuits

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Accurate chromatic dispersion characterization of photonic integrated circuits

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Mas Gomez, SM.; Matres Abril, J.; Martí Sendra, J.; Oton Nieto, CJ. (2012). Accurate chromatic dispersion characterization of photonic integrated circuits. IEEE Photonics Journal. 4(3):825-831. doi:10.1109/JPHOT.2012.2199294

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/54030

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Title: Accurate chromatic dispersion characterization of photonic integrated circuits
Author:
UPV Unit: Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Issued date:
Abstract:
An accurate technique to characterize chromatic dispersion and its slope versus wavelength is reported. The method is based on a heterodyne Mach-Zehnder interferometer, which is immune to thermal phase noise by using a ...[+]
Subjects: Silicon nanophotonics , Waveguides
Copyrigths: Reserva de todos los derechos
Source:
IEEE Photonics Journal. (issn: 1943-0655 )
DOI: 10.1109/JPHOT.2012.2199294
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publisher version: http://dx.doi.org/10.1109/JPHOT.2012.2199294
Thanks:
Manuscript received March 23, 2012; revised May 5, 2012; accepted May 7, 2012. Date of current version May 22, 2012. This work was supported by the Spanish Ministry of Science and Innovation through contracts SINADEC ...[+]
Type: Artículo

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