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Accurate chromatic dispersion characterization of photonic integrated circuits

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Accurate chromatic dispersion characterization of photonic integrated circuits

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dc.contributor.author Mas Gómez, Sara María es_ES
dc.contributor.author Matres Abril, Joaquín es_ES
dc.contributor.author Martí Sendra, Javier es_ES
dc.contributor.author Oton Nieto, Claudio José es_ES
dc.date.accessioned 2015-07-31T09:19:19Z
dc.date.available 2015-07-31T09:19:19Z
dc.date.issued 2012-06
dc.identifier.issn 1943-0655
dc.identifier.uri http://hdl.handle.net/10251/54030
dc.description.abstract An accurate technique to characterize chromatic dispersion and its slope versus wavelength is reported. The method is based on a heterodyne Mach-Zehnder interferometer, which is immune to thermal phase noise by using a counterpropagating reference beam. Chromatic dispersion profiles are obtained over a broad wavelength region even in short waveguides with considerable loss. Conventional strip silicon waveguides as well as slotted geometries are considered. Theoretical simulations are also presented for comparison, which show good agreement with the experimental results. es_ES
dc.description.sponsorship Manuscript received March 23, 2012; revised May 5, 2012; accepted May 7, 2012. Date of current version May 22, 2012. This work was supported by the Spanish Ministry of Science and Innovation through contracts SINADEC (TEC2008-06333) and DEMOTEC (TEC2008-06360), from Generalitat Valenciana through PROMETEO-2010-087 RD Excellence Program (NANOMET) and Universitat Politecnica de Valencia through PAID-06-10 project 1914. Corresponding author: S. Mas (e-mail: smasg@ntc.upv.es). en_EN
dc.language Inglés es_ES
dc.publisher Institute of Electrical and Electronics Engineers (IEEE) es_ES
dc.relation.ispartof IEEE Photonics Journal es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Silicon nanophotonics es_ES
dc.subject Waveguides es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Accurate chromatic dispersion characterization of photonic integrated circuits es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1109/JPHOT.2012.2199294
dc.relation.projectID info:eu-repo/grantAgreement/MICINN//TEC2008-06333/ES/DISPOSITIVOS NANOFOTONICOS EN SILICIO/ es_ES
dc.relation.projectID info:eu-repo/grantAgreement/MICINN//TEC2008-06360/ES/DESARROLLO DE ESTRUCTURAS DE ONDA LENTA PARA LA MEJORA DE PRESTACIONES DE MODULADORES EN TECNOLOGIA DE SILICIO/ es_ES
dc.relation.projectID info:eu-repo/grantAgreement/GVA//PROMETEO%2F2010%2F087/ES/DESARROLLO DE NUEVOS DISPOSITIVOS NANOFOTONICOS BASADOS EN GUIAS DE SILICIO Y METAMATERIALES/ es_ES
dc.relation.projectID info:eu-repo/grantAgreement/UPV//PAID-06-10-1914/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.description.bibliographicCitation Mas Gómez, SM.; Matres Abril, J.; Martí Sendra, J.; Oton Nieto, CJ. (2012). Accurate chromatic dispersion characterization of photonic integrated circuits. IEEE Photonics Journal. 4(3):825-831. https://doi.org/10.1109/JPHOT.2012.2199294 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1109/JPHOT.2012.2199294 es_ES
dc.description.upvformatpinicio 825 es_ES
dc.description.upvformatpfin 831 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 4 es_ES
dc.description.issue 3 es_ES
dc.relation.senia 222740
dc.contributor.funder Generalitat Valenciana es_ES
dc.contributor.funder Universitat Politècnica de València es_ES


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