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Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions

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Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions

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Díaz Caballero, E.; Belenguer Martínez, Á.; Esteban González, H.; Boria Esbert, VE. (2013). Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions. Electronics Letters. 49(2):132-133. doi:10.1049/el.2012.3027

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/54684

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Title: Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions
Author: Díaz Caballero, Elena Belenguer Martínez, Ángel Esteban González, Héctor Boria Esbert, Vicente Enrique
UPV Unit: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Universitat Politècnica de València. Instituto Universitario de Telecomunicación y Aplicaciones Multimedia - Institut Universitari de Telecomunicacions i Aplicacions Multimèdia
Issued date:
Abstract:
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by ...[+]
Subjects: Substrate integrated waveguides (SIW)
Copyrigths: Reserva de todos los derechos
Source:
Electronics Letters. (issn: 0013-5194 )
DOI: 10.1049/el.2012.3027
Publisher:
Institution of Engineering and Technology (IET)
Publisher version: http://dx.doi.org/10.1049/el.2012.3027
Type: Artículo

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