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Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions

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Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions

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Fernández Berlanga, M.; Ballesteros Garrido, J.; Martínez Cano, L.; Esteban González, H.; Belenguer Martínez, A. (2015). Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions. Electronics Letters. 51(16):1274-1276. doi:10.1049/el.2015.1393

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/64593

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Title: Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Issued date:
Abstract:
In past years, a great number of substrate integrated circuits have been developed. Among these new transmission lines, the substrate integrated waveguide (SIW) has received special attention. Although the quality factor ...[+]
Copyrigths: Reserva de todos los derechos
Source:
Electronics Letters. (issn: 0013-5194 )
DOI: 10.1049/el.2015.1393
Publisher:
Institution of Engineering and Technology (IET)
Publisher version: http://dx.doi.org/10.1049/el.2015.1393
Type: Artículo

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