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Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions

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Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions

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dc.contributor.author Fernández Berlanga, M.D. es_ES
dc.contributor.author Ballesteros Garrido, J.A. es_ES
dc.contributor.author Martínez Cano, L. es_ES
dc.contributor.author Esteban González, Héctor es_ES
dc.contributor.author Belenguer Martínez, A. es_ES
dc.date.accessioned 2016-05-23T10:41:38Z
dc.date.available 2016-05-23T10:41:38Z
dc.date.issued 2015-06-08
dc.identifier.issn 0013-5194
dc.identifier.uri http://hdl.handle.net/10251/64593
dc.description.abstract In past years, a great number of substrate integrated circuits have been developed. Among these new transmission lines, the substrate integrated waveguide (SIW) has received special attention. Although the quality factor and losses of these new integrated lines are better than the planar circuits, these characteristics are worst than in the case of waveguides, mainly due to the presence of dielectric substrate. To improve the performance of the integrated circuits, a new methodology for manufacturing the empty waveguides, without dielectric substrate, but at the same time completely integrated in a planar substrate, has been recently proposed, resulting in the novel empty SIW (ESIW). A low-cost and easy to manufacture thru reflect line calibration kit for de-embedding the effect of connectors and transitions when measuring ESIW devices is presented. Results prove the high quality of this calibration kit. es_ES
dc.language Inglés es_ES
dc.publisher Institution of Engineering and Technology (IET) es_ES
dc.relation.ispartof Electronics Letters es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1049/el.2015.1393
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.description.bibliographicCitation Fernández Berlanga, M.; Ballesteros Garrido, J.; Martínez Cano, L.; Esteban González, H.; Belenguer Martínez, A. (2015). Thru reflect line calibration for empty substrate integrated waveguide with microstrip transitions. Electronics Letters. 51(16):1274-1276. doi:10.1049/el.2015.1393 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1049/el.2015.1393 es_ES
dc.description.upvformatpinicio 1274 es_ES
dc.description.upvformatpfin 1276 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 51 es_ES
dc.description.issue 16 es_ES
dc.relation.senia 297769 es_ES


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