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A Brief Comment on "A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs"

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A Brief Comment on "A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs"

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Bishnoi, R.; Laxmi, V.; Gaur, MS.; Flich Cardo, J.; Trivino, F. (2015). A Brief Comment on "A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs". ACM Transactions in Embedded Computing Systems. 14(1):1-9. doi:10.1145/2668121

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/65562

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Title: A Brief Comment on "A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs"
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Issued date:
Abstract:
[EN] In the Ghiribaldi et al. [2013] paper, a complete self-testing and self configuring NoC infrastructure for cost-effective MPSoCs was presented in order to make NoC architecture tolerant to faults. To overcome the ...[+]
Subjects: Design , Algorithms , Reliability , Network-on-Chip , Fault tolerance
Copyrigths: Reserva de todos los derechos
Source:
ACM Transactions in Embedded Computing Systems. (issn: 1539-9087 )
DOI: 10.1145/2668121
Publisher:
Association for Computing Machinery (ACM)
Publisher version: http://dx.doi.org/10.1145/2668121
Description: © ACM, 2015. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in ACM Transactions on Embedded Computing Systems, Vol. 14, No. 1, Article 2, january 2015. http://doi.acm.org/10.1145/2668121
Thanks:
This work is supported by Indo-Spain DST project under grant DST/INT/Spain/P35/11/1 and Spanish Ministerio de Economa y Competitividad (MINECO) under grant PRI-PIBIN-2011-0989
Type: Artículo

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