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dc.contributor.author | Espinosa García, Jaime | es_ES |
dc.contributor.author | Hernández Luz, Carles | es_ES |
dc.contributor.author | Abella, Jaume | es_ES |
dc.contributor.author | Andrés Martínez, David de | es_ES |
dc.contributor.author | Ruiz García, Juan Carlos | |
dc.date.accessioned | 2016-06-09T10:33:21Z | |
dc.date.available | 2016-06-09T10:33:21Z | |
dc.date.issued | 2015-06 | |
dc.identifier.isbn | 978-1-4503-3520-1 | |
dc.identifier.uri | http://hdl.handle.net/10251/65584 | |
dc.description | © ACM 2015 This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in ACM, In Proceedings of the 52nd Annual Design Automation Conference (p. 40). http://dx.doi.org/10.1145/2744769.2744798. | es_ES |
dc.description.abstract | Increasingly complex microcontroller designs for safety-relevant automotive systems require the adoption of new methods and tools to enable a cost-effective verification of their robustness. In particular, costs associated to the certification against the IS026262 safety standard must be kept low for economical reasons. In this context, simulation-based verification using instruction set simulators (ISS) arises as a promising approach to partially cope with the increasing cost of the verification process as it allows taking design decisions in early design stages when modifications can be performed quickly and with low cost. However, it remains to be proven that verification in those stages provides accurate enough information to be used in the context of automotive microcontrollers. In this paper we analyze the existing correlation between fault injection experiments in an RTL microcontroller description and the information available at the ISS to enable accurate ISS-based fault injection. | es_ES |
dc.description.sponsorship | The research leading to these results has received funding from the ARTEMIS Joint Undertaking VeTeSS project under grant agreement number 295311. This work has also been funded by the Ministry of Science and Technology of Spain under contract TIN2012-34557 and HiPEAC. Jaume Abella is partially supported by the Ministry of Economy and Competitiveness under Ramon y Cajal postdoctoral fellowship number RYC-2013-14717. | es_ES |
dc.format.extent | 6 | es_ES |
dc.language | Inglés | es_ES |
dc.publisher | ACM | es_ES |
dc.rights | Reserva de todos los derechos | es_ES |
dc.subject.classification | INGENIERIA DE SISTEMAS Y AUTOMATICA | es_ES |
dc.subject.classification | ARQUITECTURA Y TECNOLOGIA DE COMPUTADORES | es_ES |
dc.title | Analysis and RTL Correlation of Instruction Set Simulators for Automotive Microcontroller Robustness Verification | es_ES |
dc.type | Comunicación en congreso | es_ES |
dc.identifier.doi | 10.1145/2744769.2744798 | |
dc.relation.projectID | info:eu-repo/grantAgreement/EC/FP7/295311/EU/Verification and Testing to Support Functional Safety Standards/ | es_ES |
dc.relation.projectID | info:eu-repo/grantAgreement/MICINN//TIN2012-34557/ES/COMPUTACION DE ALTAS PRESTACIONES VI/ | es_ES |
dc.relation.projectID | info:eu-repo/grantAgreement/EC/H2020/871174/EU/High Performance Embedded Architecture and Compilation/ | es_ES |
dc.relation.projectID | info:eu-repo/grantAgreement/MINECO//RYC-2013-14717/ES/RYC-2013-14717/ | es_ES |
dc.rights.accessRights | Abierto | es_ES |
dc.contributor.affiliation | Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors | es_ES |
dc.contributor.affiliation | Universitat Politècnica de València. Departamento de Ingeniería de Sistemas y Automática - Departament d'Enginyeria de Sistemes i Automàtica | es_ES |
dc.description.bibliographicCitation | Espinosa García, J.; Hernández Luz, C.; Abella, J.; Andrés Martínez, DD.; Ruiz García, JC. (2015). Analysis and RTL Correlation of Instruction Set Simulators for Automotive Microcontroller Robustness Verification. ACM. https://doi.org/10.1145/2744769.2744798 | es_ES |
dc.description.accrualMethod | S | es_ES |
dc.relation.conferencename | 52nd Design Automation Conference (DAC 2015) | es_ES |
dc.relation.conferencedate | June, 7-11, 2015 | es_ES |
dc.relation.conferenceplace | San Francisco, USA | es_ES |
dc.relation.publisherversion | http://dl.acm.org/citation.cfm?doid=2744769.2744798 | es_ES |
dc.type.version | info:eu-repo/semantics/publishedVersion | es_ES |
dc.relation.senia | 299128 | es_ES |
dc.contributor.funder | European Commission | es_ES |
dc.contributor.funder | Ministerio de Ciencia e Innovación | es_ES |
dc.contributor.funder | European Network on High-performance Embedded Architecture and Compilation | es_ES |
dc.contributor.funder | Ministerio de Economía y Competitividad | es_ES |
dc.description.references | ARTEMIS Joint Undertaking.VeTeSS project:www.vetess.eu. | es_ES |
dc.description.references | J.-C. Baraza, et al. Enhancement of fault injection techniques based on the modification of vhdl code.IEEE Transactions on VLSI, 16(6):693--706, June 2008. | es_ES |
dc.description.references | Alfredo Benso et al.Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation.Kluwer Academic Publishers, 2003. | es_ES |
dc.description.references | D. Borodin et al. Protective redundancy overhead reduction using instruction vulnerability factor. InCF, 2010. | es_ES |
dc.description.references | R. N. Charette. This car runs on code. InIEEE Spectrum online, 2009. | es_ES |
dc.description.references | Pedro Gil, et al. Fault representativeness. Technical report, DBench project, IST 2000-25425 [Online]. Available: http://www.laas.fr/DBench, 2002. | es_ES |
dc.description.references | C. Hernandez et al. Live: Timely error detection in light-lockstep safety critical systems. InDAC, 2014. | es_ES |
dc.description.references | Infineon. AURIX - TriCore datasheet. highly integrated and performance optimized 32-bit microcontrollers for automotive and industrial applications, 2012. http://www.infineon.com/. | es_ES |
dc.description.references | International Organization for Standardization.ISO/DIS 26262. Road Vehicles--Functional Safety, 2009. | es_ES |
dc.description.references | E. Jenn, et al. Fault injection into VHDL models: the mefisto tool. InFTCS, 1994. | es_ES |
dc.description.references | G. Leen et al. Expanding automotive electronic systems.IEEE Computer, 35(1), 2002. | es_ES |
dc.description.references | Man-Lap Li, et al. Accurate microarchitecture-level fault modeling for studying hardware faults. InHPCA, 2009. | es_ES |
dc.description.references | Michail Maniatakos, et al. Instruction-level impact analysis of low-level faults in a modern microprocessor controller.IEEE Transactions on Computers, 60(9):1260--1273, 2011. | es_ES |
dc.description.references | S. S. Mukherjee, et al. A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor. InMICRO, 2003. | es_ES |
dc.description.references | J.-H. Oetjens, et al. Safety evaluation of automotive electronics using virtual prototypes: State of the art and research challenges. InDAC, 2014. | es_ES |
dc.description.references | J. Poovey.Characterization of the EEMBC Benchmark Suite.North Carolina State University, 2007. | es_ES |
dc.description.references | M. Psarakis, et al. Microprocessor software-based self-testing.Design Test of Computers, IEEE, 27(3):4--19, May 2010. | es_ES |
dc.description.references | S. Rehman, et al. Reliable software for unreliable hardware: Embedded code generation aiming at reliability. InCODES+ISSS, 2011. | es_ES |
dc.description.references | S. Rohr, et al. An integrated approach to automotive safety systems.SAE Automotive Engineering International magazine, September 2000. | es_ES |
dc.description.references | B. Sangchoolie, et al. A study of the impact of bit-flip errors on programs compiled with different optimization levels. InEDCC, 2014. | es_ES |
dc.description.references | STMicroelectronics.32-bit Power Architecture microcontroller for automotive SIL3/ASILD chassis and safety applications, 2014. | es_ES |
dc.description.references | http://www.gaisler.com/cms/index.php?option=com_content&task=view&id=13&Itemid=53.Leon3 Processor.Areroflex Gaisler. | es_ES |