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Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults

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Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults

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Espinosa Garcia, J.; Andrés Martínez, DD.; Gil, P. (2015). Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults. IEEE Computer Society - Conference Publishing Services (CPS). doi:10.1109/EDCC.2015.13

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/65596

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Title: Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Universitat Politècnica de València. Departamento de Ingeniería de Sistemas y Automática - Departament d'Enginyeria de Sistemes i Automàtica
Issued date:
Abstract:
Technology advances provide a myriad of advantages for VLSI systems, but also increase the sensitivity of the combinational logic to different fault profiles. Shorter and shorter faults which up to date had been filtered, ...[+]
Subjects: Fugacious faults , Fault detection , Fault diagnosis
Copyrigths: Reserva de todos los derechos
DOI: 10.1109/EDCC.2015.13
Publisher:
IEEE Computer Society - Conference Publishing Services (CPS)
Publisher version: http://dx.doi.org/10.1109/EDCC.2015.13
Conference name: 11th European Dependable Computing Conference (EDCC 2015)
Conference place: Paris, France
Conference date: September 7-11, 2015
Type: Comunicación en congreso

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