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Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults

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Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults

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dc.contributor.author Espinosa García, Jaime es_ES
dc.contributor.author Andrés Martínez, David de es_ES
dc.contributor.author Gil, Pedro es_ES
dc.date.accessioned 2016-06-09T12:06:06Z
dc.date.available 2016-06-09T12:06:06Z
dc.date.issued 2015-09
dc.identifier.uri http://hdl.handle.net/10251/65596
dc.description.abstract Technology advances provide a myriad of advantages for VLSI systems, but also increase the sensitivity of the combinational logic to different fault profiles. Shorter and shorter faults which up to date had been filtered, named as fugacious faults, require new attention as they are considered a feasible sign of warning prior to potential failures. Despite their increasing impact on modern VLSI systems, such faults are not largely considered today by the safety industry. Their early detection is however critical to enable an early evaluation of potential risks for the system and the subsequent deployment of suitable failure avoidance mechanisms. For instance, the early detection of fugacious faults will provide the necessary means to extend the mission time of a system thanks to the temporal avoidance of aging effects. Because classical detection mechanisms are not suited to cope with such fugacious faults, this paper proposes a method specifically designed to detect and diagnose them. Reported experiments will show the feasibility and interest of the proposal. es_ES
dc.description.sponsorship This work has been funded by the Spanish Ministry of Economy ARENES project (TIN2012-38308-C02—01). es_ES
dc.format.extent 8 es_ES
dc.language Inglés es_ES
dc.publisher IEEE Computer Society - Conference Publishing Services (CPS) es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Fugacious faults es_ES
dc.subject Fault detection es_ES
dc.subject Fault diagnosis es_ES
dc.subject.classification INGENIERIA DE SISTEMAS Y AUTOMATICA es_ES
dc.subject.classification ARQUITECTURA Y TECNOLOGIA DE COMPUTADORES es_ES
dc.title Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults es_ES
dc.type Comunicación en congreso es_ES
dc.identifier.doi 10.1109/EDCC.2015.13
dc.relation.projectID info:eu-repo/grantAgreement/MINECO//TIN2012-38308-C02-01/ES/ADAPTIVE AND RESILIENT NETWORKED EMBEDDED SYSTEMS/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería de Sistemas y Automática - Departament d'Enginyeria de Sistemes i Automàtica es_ES
dc.description.bibliographicCitation Espinosa García, J.; Andrés Martínez, DD.; Gil, P. (2015). Increasing the Dependability of VLSI Systems Through Early Detection of Fugacious Faults. IEEE Computer Society - Conference Publishing Services (CPS). https://doi.org/10.1109/EDCC.2015.13 es_ES
dc.description.accrualMethod S es_ES
dc.relation.conferencename 11th European Dependable Computing Conference (EDCC 2015) es_ES
dc.relation.conferencedate September 7-11, 2015 es_ES
dc.relation.conferenceplace Paris, France es_ES
dc.relation.publisherversion http://dx.doi.org/10.1109/EDCC.2015.13 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.relation.senia 299101 es_ES
dc.contributor.funder Ministerio de Economía y Competitividad es_ES


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