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The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs

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The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs

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Espinosa Garcia, J.; Andrés Martínez, DD.; Ruiz, JC.; Gil, P. (2013). The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs. En Dependable Computing. Springer. 76-87. doi:10.1007/978-3-642-38789-0_7

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/70959

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Title: The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs
Author:
UPV Unit: Universitat Politècnica de València. Escola Tècnica Superior d'Enginyeria Informàtica
Universitat Politècnica de València. Departamento de Ingeniería de Sistemas y Automática - Departament d'Enginyeria de Sistemes i Automàtica
Issued date:
Abstract:
Current integration scales are increasing the number and types of faults that embedded systems must face. Traditional approaches focus on dealing with those transient and permanent faults that impact the state or output ...[+]
Subjects: Fault detection , Transient faults , Intermittent faults , Permanent faults , Fault diagnosis , VLSI design workflow
Copyrigths: Reserva de todos los derechos
ISBN: 978-3-642-38788-3
Source:
Dependable Computing. (issn: 0302-9743 )
DOI: 10.1007/978-3-642-38789-0_7
Publisher:
Springer
Publisher version: http://link.springer.com/chapter/10.1007/978-3-642-38789-0_7
Conference name: 14th European Workshop on Dependable Computing (EWDC 2013)
Conference place: Coimbra, Portugal
Conference date: May 15-16, 2013
Series: Lecture Notes in Computer Science;7869
Description: The final publication is available at Springer via http://dx.doi.org/10.1007/978-3-642-38789-0_7
Type: Capítulo de libro Comunicación en congreso

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