Bhavnagarwala, A.J., et al.: The Impact of Intrinsic Device Fluctuations on CMOS SRAM Cell Stability. IEEE Journal of Solid-State Circuits 36(4), 658–665 (2001)
Mukhopadhyay, S., et al.: Modeling of Failure Probability and Statistical Design of SRAM Array for Yield Enhancement in Nanoscaled CMOS. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24(12), 1859–1880 (2005)
Shirvani, P.P., McCluskey, E.J.: PADded Cache: A New Fault-Tolerance Technique for Cache Memories. In: Proceedings of the 17th IEEE VLSI Test Symposium, pp. 440–445 (1999)
[+]
Bhavnagarwala, A.J., et al.: The Impact of Intrinsic Device Fluctuations on CMOS SRAM Cell Stability. IEEE Journal of Solid-State Circuits 36(4), 658–665 (2001)
Mukhopadhyay, S., et al.: Modeling of Failure Probability and Statistical Design of SRAM Array for Yield Enhancement in Nanoscaled CMOS. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24(12), 1859–1880 (2005)
Shirvani, P.P., McCluskey, E.J.: PADded Cache: A New Fault-Tolerance Technique for Cache Memories. In: Proceedings of the 17th IEEE VLSI Test Symposium, pp. 440–445 (1999)
Wilkerson, C., et al.: Trading off Cache Capacity for Reliability to Enable Low Voltage Operation. In: Proceedings of the 35th Annual International Symposium on Computer Architecture, pp. 203–214 (2008)
Agarwal, A., et al.: Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture. IEEE Journal of Solid-State Circuits 40(9), 1804–1814 (2005)
Ansari, A., et al.: Archipelago: A Polymorphic Cache Design for Enabling Robust Near-Threshold Operation. In: Proceedings of the 17th International Symposium on High Performance Computer Architecture, pp. 539–550 (2011)
Nomura, S., et al.: Sampling + DMR: Practical and Low-overhead Permanent Fault Detection. In: Proceedings of the 38th Annual International Symposium on Computer Architecture, pp. 201–212 (2011)
Sinharoy, B., et al.: IBM POWER7 multicore server processor. IBM Journal of Research and Development 55(3) (2011)
Lorente, V., et al.: Combining RAM technologies for hard-error recovery in L1 data caches working at very-low power modes. In: Proceedings of the Design, Automation, and Test in Europe Conference, pp. 83–88 (2013)
Kanter, D.: Intel’s Haswell CPU Microarchitecture, ”Real World Technologies” (November 13, 2012), http://www.realworldtech.com/haswell-cpu/
Paul, S., et al.: Reliability-Driven ECC Allocation for Multiple Bit Error Resilience in Processor Cache. IEEE Transactions on Computers 60(1), 20–34 (2011)
Alameldeen, A.R., et al.: Adaptive Cache Design to Enable Reliable Low-Voltage Operation. IEEE Transactions on Computers 60, 50–63 (2011)
Dreslinski, R.G., et al.: Reconfigurable Energy Efficient Near Threshold Cache Architectures. In: Proceedings of the 41st Annual IEEE/ACM International Symposium on Microarchitecture, pp. 459–470 (2008)
Wilkerson, C., et al.: Reducing Cache Power with Low-Cost, Multi-bit Error-Correcting Codes. In: Proceedings of the 37th Annual International Symposium on Computer Architecture, pp. 83–93 (2010)
Burger, D., Austin, T.M.: The SimpleScalar Tool Set, Version 2.0. ACM SIGARCH Computer Architecture News 25(3), 13–25 (1997)
Thoziyoor, S., et al.: CACTI 5.1. Hewlett-Packard Laboratories, Palo Alto, Technical Report (2008)
spec2000: Standard Performance Evaluation Corporation, http://www.spec.org/cpu2000
Kulkarni, J.P., et al.: A 160 mV, Fully Differential, Robust Schmitt Trigger Based Sub-threshold SRAM. In: Proceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design, pp. 171–176 (2007)
Keeth, B., et al.: DRAM Circuit Design. Fundamental and High-Speed Topics. John Wiley and Sons, Inc., Hoboken (2008)
Mueller, W., et al.: Challenges for the DRAM Cell Scaling to 40nm. In: IEEE International Electron Devices Meeting 4, pp. 336–339 (2005)
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