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Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC)

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Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC)

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Leydesdorff, L.; Kushnir, D.; Rafols García, I. (2014). Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC). Scientometrics. 98(3):1583-1599. https://doi.org/10.1007/s11192-012-0923-2

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/86315

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Metadatos del ítem

Título: Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC)
Autor: Leydesdorff, L. Kushnir, Duncan Rafols García, Ismael
Entidad UPV: Universitat Politècnica de València. Instituto de Gestión de la Innovación y del Conocimiento - Institut de Gestió de la Innovació i del Coneixement
Fecha difusión:
Resumen:
[EN] We report on the development of an interface to the US Patent and Trademark Office (USPTO) that allows for the mapping of patent portfolios as overlays to basemaps constructed from citation relations among all patents ...[+]
Palabras clave: Map , USPTO , IPC , Patent , Classification , Overlay
Derechos de uso: Reserva de todos los derechos
Fuente:
Scientometrics. (issn: 0138-9130 ) (eissn: 1588-2861 )
DOI: 10.1007/s11192-012-0923-2
Editorial:
Springer
Versión del editor: http://doi.org/10.1007/s11192-012-0923-2
Código del Proyecto:
info:eu-repo/grantAgreement/ESRC//RES-360-25-0076/GB/Mapping the Dynamics of Emergent Technologies/
Agradecimientos:
We acknowledge support by the ESRC project 'Mapping the Dynamics of Emergent Technologies' (RES-360-25-0076). We are grateful to Nils Newman and Antoine Schoen for previous comments and communications.
Tipo: Artículo

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