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Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC)

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Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC)

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dc.contributor.author Leydesdorff, L. es_ES
dc.contributor.author Kushnir, Duncan es_ES
dc.contributor.author Rafols García, Ismael es_ES
dc.date.accessioned 2017-09-04T11:02:08Z
dc.date.available 2017-09-04T11:02:08Z
dc.date.issued 2014-03
dc.identifier.issn 0138-9130
dc.identifier.uri http://hdl.handle.net/10251/86315
dc.description.abstract [EN] We report on the development of an interface to the US Patent and Trademark Office (USPTO) that allows for the mapping of patent portfolios as overlays to basemaps constructed from citation relations among all patents contained in this database during the period 1976-2011. Both the interface and the data are in the public domain; the freeware programs VOSViewer and/or Pajek can be used for the visualization. These basemaps and overlays can be generated at both the 3-digit and 4-digit levels of the International Patent Classification (IPC) of the world intellectual property organization (WIPO). The basemaps can provide a stable mental framework for analysts to follow developments over searches for different years, which can be animated. The full flexibility of the advanced search engines of USPTO are available for generating sets of patents and/or patent applications which can thus be visualized and compared. This instrument allows for addressing questions about technological distance, diversity in portfolios, and animating the developments of both technologies and technological capacities of organizations over time. es_ES
dc.description.sponsorship We acknowledge support by the ESRC project 'Mapping the Dynamics of Emergent Technologies' (RES-360-25-0076). We are grateful to Nils Newman and Antoine Schoen for previous comments and communications. en_EN
dc.language Inglés es_ES
dc.publisher Springer es_ES
dc.relation.ispartof Scientometrics es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Map es_ES
dc.subject USPTO es_ES
dc.subject IPC es_ES
dc.subject Patent es_ES
dc.subject Classification es_ES
dc.subject Overlay es_ES
dc.title Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC) es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1007/s11192-012-0923-2
dc.relation.projectID info:eu-repo/grantAgreement/ESRC//RES-360-25-0076/GB/Mapping the Dynamics of Emergent Technologies/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto de Gestión de la Innovación y del Conocimiento - Institut de Gestió de la Innovació i del Coneixement es_ES
dc.description.bibliographicCitation Leydesdorff, L.; Kushnir, D.; Rafols García, I. (2014). Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC). Scientometrics. 98(3):1583-1599. https://doi.org/10.1007/s11192-012-0923-2 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://doi.org/10.1007/s11192-012-0923-2 es_ES
dc.description.upvformatpinicio 1583 es_ES
dc.description.upvformatpfin 1599 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 98 es_ES
dc.description.issue 3 es_ES
dc.relation.senia 290452 es_ES
dc.identifier.eissn 1588-2861
dc.contributor.funder Economic and Social Research Council, Reino Unido es_ES
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