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Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method

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Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method

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Gallardo Bermell, S.; Ródenas Diago, J.; Verdú Martín, GJ. (2019). Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method. Radiation Physics and Chemistry. 155:233-238. https://doi.org/10.1016/j.radphyschem.2018.09.014

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/142159

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Title: Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method
Author: Gallardo Bermell, Sergio Ródenas Diago, José Verdú Martín, Gumersindo Jesús
UPV Unit: Universitat Politècnica de València. Departamento de Ingeniería Química y Nuclear - Departament d'Enginyeria Química i Nuclear
Issued date:
Abstract:
[EN] The primary X-ray spectrum depends on different parameters such as high voltage, filament current, high voltage ripple, anode angle and thickness of filter material. The objective of this work is to determine whether ...[+]
Subjects: Discrete , Regularization
Copyrigths: Reserva de todos los derechos
Source:
Radiation Physics and Chemistry. (issn: 0969-806X )
DOI: 10.1016/j.radphyschem.2018.09.014
Publisher:
Elsevier
Publisher version: https://doi.org/10.1016/j.radphyschem.2018.09.014
Conference name: 10th International Topical Meeting on Industrial Radiation and Radioisotope Measurement Applications (IRRMA-X)
Conference place: Chicago, USA
Conference date: Julio 09-13,2017
Type: Artículo Comunicación en congreso

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