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Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method

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Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method

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dc.contributor.author Gallardo Bermell, Sergio es_ES
dc.contributor.author Ródenas Diago, José es_ES
dc.contributor.author Verdú Martín, Gumersindo Jesús es_ES
dc.date.accessioned 2020-05-04T06:28:07Z
dc.date.available 2020-05-04T06:28:07Z
dc.date.issued 2019-02 es_ES
dc.identifier.issn 0969-806X es_ES
dc.identifier.uri http://hdl.handle.net/10251/142159
dc.description.abstract [EN] The primary X-ray spectrum depends on different parameters such as high voltage, filament current, high voltage ripple, anode angle and thickness of filter material. The objective of this work is to determine whether the unfolding technique based on the Tikhonov regularization method is accurate enough to estimate the X-ray spectrum when slight changes in the operation variables are considered. In this frame, several X-ray spectra are considered (extracted from the IPEM78 Catalogue Report) varying the main operation variables of the X-ray tube (high voltage, voltage ripple, filter thickness and filter material). With those spectra, the corresponding absorbed dose curves are obtained by simulation with a MCNP5 model reproducing a flat panel detector and a PMMA wedge. Once the absorbed dose curves are simulated and applying the unfolding Tikhonov regularization method, the unfolded spectrum is obtained, which is finally compared with the theoretical one (IPEM78 Catalogue Report). Discrepancies between unfolded and primary X-ray spectra can be attributed to the fact that this is an ill-posed problem, and the unfolding of the spectrum is strongly affected by the method used to improve the conditioning of the response function (response matrix). es_ES
dc.language Inglés es_ES
dc.publisher Elsevier es_ES
dc.relation.ispartof Radiation Physics and Chemistry es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Discrete es_ES
dc.subject Regularization es_ES
dc.subject.classification INGENIERIA NUCLEAR es_ES
dc.title Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method es_ES
dc.type Artículo es_ES
dc.type Comunicación en congreso es_ES
dc.identifier.doi 10.1016/j.radphyschem.2018.09.014 es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería Química y Nuclear - Departament d'Enginyeria Química i Nuclear es_ES
dc.description.bibliographicCitation Gallardo Bermell, S.; Ródenas Diago, J.; Verdú Martín, GJ. (2019). Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method. Radiation Physics and Chemistry. 155:233-238. https://doi.org/10.1016/j.radphyschem.2018.09.014 es_ES
dc.description.accrualMethod S es_ES
dc.relation.conferencename 10th International Topical Meeting on Industrial Radiation and Radioisotope Measurement Applications (IRRMA-X) es_ES
dc.relation.conferencedate Julio 09-13,2017 es_ES
dc.relation.conferenceplace Chicago, USA es_ES
dc.relation.publisherversion https://doi.org/10.1016/j.radphyschem.2018.09.014 es_ES
dc.description.upvformatpinicio 233 es_ES
dc.description.upvformatpfin 238 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 155 es_ES
dc.relation.pasarela S\374398 es_ES


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