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Gallardo Bermell, S.; Ródenas Diago, J.; Verdú Martín, GJ. (2019). Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method. Radiation Physics and Chemistry. 155:233-238. https://doi.org/10.1016/j.radphyschem.2018.09.014
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/142159
Título: | Unfolding X-ray spectra using a flat panel detector. Determination of the accuracy of the method with the Monte Carlo method | |
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[EN] The primary X-ray spectrum depends on different parameters such as high voltage, filament current, high voltage ripple, anode angle and thickness of filter material.
The objective of this work is to determine whether ...[+]
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Derechos de uso: | Reserva de todos los derechos | |
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Versión del editor: | https://doi.org/10.1016/j.radphyschem.2018.09.014 | |
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